| Manufacturer | Part # | Datasheet | Description |

Fuji Electric
|
EDS3-145 |
1Mb/12P |
INFRARED GAS ANALYZER(LOW-CONCENTRATION MEASUREMENT TYPE) |

Rohm
|
SML-012VT |
148Kb/3P |
SML-01 Series Reflector improved the concentration of viewing angle |

Texas Instruments
|
LM306 |
313Kb/15P |
Fast Response Times Improved Gain and Accuracy |

Connor-Winfield Corpora...
|
TB512-052M |
1Mb/6P |
Improved Performance 5x7mm TB / TVB Model Series |

Fuji Electric
|
EDS3-144 |
1Mb/18P |
INFRARED GAS ANALYZER(HIGH PERFORMANCE MODEL) |

MKS Instruments.
|
AA02A |
270Kb/4P |
All-digital architecture and improved thermal management provides better long-term stability, improved accuracy and increased reliability |

Figaro Engineering Inc.
|
FECS44-100 |
364Kb/2P |
Detection of Low Concentration Ammonia |
| FECS44-1000 |
365Kb/2P |
Detection of High Concentration Ammonia |

Maxim Integrated Produc...
|
MAX9633 |
808Kb/12P |
Improved Reliability Rev 4; 1/15 |

Hamamatsu Corporation
|
T11722-01 |
167Kb/4P |
For CO2 concentration measurement High sensitivity |

MKS Instruments.
|
AA01A |
271Kb/4P |
All products are specified in percent of Reading for best accuracy and improved process yield |

TT Electronics.
|
PWC |
672Kb/4P |
improved working voltage |

Silicon Laboratories
|
TS6001 |
1Mb/13P |
Improved Electrical Performance |

Samsung semiconductor
|
IRFS640A |
304Kb/6P |
Improved gate charge |

Sony Corporation
|
DVP-C600D |
7Mb/26P |
US Model, Canadian Model, Mexican Model |

Advanced Power Electron...
|
AP02N70EJ-HF |
65Kb/4P |
ESD Improved Capability |

Samsung semiconductor
|
IRFS641 |
308Kb/5P |
Improved inductive ruggedness |
| SSP4N80 |
296Kb/5P |
improved inductive ruggedness |

Ohmite Mfg. Co.
|
RES-RX1M |
253Kb/1P |
Improved voltage stability |

Sony Corporation
|
XR-4880 |
1Mb/7P |
AEP Model UK Model |