STM32L4A6RG datasheet(178/282 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32L4A6xG

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DS11584 Rev 8

Static latch-up

Two complementary static tests are required on six parts to assess the latch-up

performance:

•

A supply overvoltage is applied to each power supply pin.

•

A current injection is applied to each input, output and configurable I/O pin.

These tests are compliant with EIA/JESD 78A IC latch-up standard.

6.3.13

I/O current injection characteristics

As a general rule, current injection to the I/O pins, due to external voltage below VSS or

above VDDIOx (for standard, 3.3 V-capable I/O pins) should be avoided during normal

product operation. However, in order to give an indication of the robustness of the

microcontroller in cases when abnormal injection accidentally happens, susceptibility tests

are performed on a sample basis during device characterization.

Functional susceptibility to I/O current injection

While a simple application is executed on the device, the device is stressed by injecting

current into the I/O pins programmed in floating input mode. While current is injected into

the I/O pin, one at a time, the device is checked for functional failures.

The failure is indicated by an out of range parameter: ADC error above a certain limit (higher

than 5 LSB TUE), out of conventional limits of induced leakage current on adjacent pins (out

of the -5 µA/+0 µA range) or other functional failure (for example reset occurrence or

oscillator frequency deviation).

The characterization results are given in Table 69.

Negative induced leakage current is caused by negative injection and positive induced

leakage current is caused by positive injection.

Table 68. Electrical sensitivities

Symbol

Parameter

Conditions

Class

Static latch-up class

TA = +105 °C conforming to JESD78A

II level A(1)

1. Negative injection is limited to -30 mA for PF0, PF1, PG6, PG7, PG8, PG12, PG13, PG14.

Table 69. I/O current injection susceptibility(1)

1. Guaranteed by characterization.

Symbol

Description

Functional

susceptibility

Unit

Negative

injection

Positive

injection

IINJ

Injected current on all pins except PA4, PA5, PB0, PF12,

PF13, OPAMP1_V1NM, OPAMP2_V1NM

-5

NA(2)

2. Injection is not possible

Injected current on pins PB0, PF12, PF13

NA(2)

Injected current on OPAMP1_V1NM, OPAMP2_V1NM

Injected current on PA4, PA5 pins

-5

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