ST72361 datasheet(192/224 Pages) STMICROELECTRONICS

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ST72361

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EMC CHARACTERISTICS (Cont’d)

12.8.3 Absolute Maximum Ratings (Electrical

Sensitivity)

Based on three different tests (ESD, LU and DLU)

using specific measurement methods, the product

is stressed in order to determine its performance in

terms of electrical sensitivity (see Table 32 and

Table 33 below). For more details, refer to applica-

tion note AN1181.

12.8.3.1 Electro-Static Discharge (ESD)

Electro-Static Discharges (a positive then a nega-

tive pulse separated by 1 second) are applied to

the pins of each sample according to each pin

combination. The sample size depends on the

number of supply pins in the device (3 parts*(n+1)

supply pin). Two models can be simulated: Human

Body Model and Machine Model. This test con-

forms to the JESD22-A114A/A115A standard.

12.8.3.2 Static and Dynamic Latch-Up

■ LU: Three complementary static tests are

required on 10 parts to assess the latch-up

performance. A supply overvoltage (applied to

each power supply pin) and a current injection

(applied to each input, output and configurable I/

O pin) are performed on each sample. This test

conforms to the EIA/JESD 78 IC latch-up

standard. For more details, refer to application

note AN1181.

■ DLU: Electro-Static Discharges (one positive

then one negative test) are applied to each pin

of three samples when the micro is running to

assess the latch-up performance in dynamic

mode. Power supplies are set to the typical

values, the oscillator is connected as near as

possible to the pins of the micro and the

component is put in reset mode. This test

conforms to the IEC1000-4-2 and SAEJ1752/3

standards. For more details, refer to application

note AN1181.

Table 32. Absolute Maximum Ratings

Notes:

1. Data based on characterization results, not tested in production.

Table 33. Electrical Sensitivities

Notes:

1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC spec-

ifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the

JEDEC criteria (international standard).

Symbol

Ratings

Conditions

Maximum value1)

Unit

VESD(HBM) Electro-static discharge voltage (Human Body Model)

TA = +25°C

2000

VESD(MM)

Electro-static discharge voltage (Machine Model)

200

VESD(CDM) Electro-static discharge voltage (Charge Device Model)

750 on corner pins,

500 on others

Symbol

Parameter

Conditions

Class1)

Static latch-up class

TA = +25°C

TA = +85°C

TA = +125°C

DLU

Dynamic latch-up class

VDD = 5.5V, fOSC = 4 MHz, TA = +25°C

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