PC312XDP512F0CFVR datasheet(1239/1348 Pages) FREESCALE

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Appendix A Electrical Characteristics

MC9S12XDP512 Data Sheet, Rev. 2.21

Freescale Semiconductor

1241

A.1.5

Absolute Maximum Ratings

Absolute maximum ratings are stress ratings only. A functional operation under or outside those maxima

is not guaranteed. Stress beyond those limits may affect the reliability or cause permanent damage of the

device.

This device contains circuitry protecting against damage due to high static voltage or electrical ﬁelds;

however, it is advised that normal precautions be taken to avoid application of any voltages higher than

maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused

inputs are tied to an appropriate logic voltage level (e.g., either VSS35 or VDD35).

A.1.6

ESD Protection and Latch-up Immunity

All ESD testing is in conformity with CDF-AEC-Q100 stress test qualiﬁcation for automotive grade

integrated circuits. During the device qualiﬁcation ESD stresses were performed for the Human Body

Model (HBM) and the Charge Device Model.

A device will be deﬁned as a failure if after exposure to ESD pulses the device no longer meets the device

speciﬁcation. Complete DC parametric and functional testing is performed per the applicable device

Table A-1. Absolute Maximum Ratings1

1 Beyond absolute maximum ratings device might be damaged.

Num

Rating

Symbol

Min

Max

Unit

I/O, regulator and analog supply voltage

VDD35

–0.3

6.0

Digital logic supply voltage2

2 The device contains an internal voltage regulator to generate the logic and PLL supply out of the I/O supply. The absolute

maximum ratings apply when the device is powered from an external source.

VDD

–0.3

3.0

PLL supply voltage2

VDDPLL

–0.3

3.0

Voltage difference VDDX to VDDR and VDDA

∆VDDX

–0.3

0.3

Voltage difference VSSX to VSSR and VSSA

∆VSSX

–0.3

0.3

Digital I/O input voltage

VIN

–0.3

6.0

Analog reference

VRH, VRL

–0.3

6.0

XFC, EXTAL, XTAL inputs

VILV

–0.3

3.0

TEST input

VTEST

–0.3

10.0

Instantaneous maximum current

Single pin limit for all digital I/O pins3

3 All digital I/O pins are internally clamped to V

SSX and VDDX, VSSR and VDDR or VSSA and VDDA.

–25

+25

Instantaneous maximum current

Single pin limit for XFC, EXTAL, XTAL4

4 Those pins are internally clamped to V

SSPLL and VDDPLL.

–25

+25

Instantaneous maximum current

Single pin limit for TEST 5

5 This pin is clamped low to V

SSPLL, but not clamped high. This pin must be tied low in applications.

–0.25

Storage temperature range

Tstg

–65

155

°C

PC312XDP512F0CFVR Datasheet(PDF) 1239 Page - Freescale Semiconductor, Inc

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