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PC312XDP512F0CFVR Datasheet(PDF) 1247 Page - Freescale Semiconductor, Inc |
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PC312XDP512F0CFVR Datasheet(HTML) 1247 Page - Freescale Semiconductor, Inc |
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1247 / 1348 page ![]() Appendix A Electrical Characteristics MC9S12XDP512 Data Sheet, Rev. 2.21 Freescale Semiconductor 1249 A.1.10 Supply Currents This section describes the current consumption characteristics of the device as well as the conditions for the measurements. A.1.10.1 Measurement Conditions All measurements are without output loads. Unless otherwise noted the currents are measured in single chip mode and the CPU and XGATE code is executed from RAM, VDD35=5.5V, internal voltage regulator is enabled and the bus frequency is 40MHz using a 4-MHz external clock source (PE7=XCLKS=0). Production testing is performed using a square wave signal at the EXTAL input. Table A-8. I/O Characteristics for Port C, D, PE5, PE6, and PK7 for Reduced Input Voltage Thresholds Conditions are 4.5 V < VDD35 < 5.5 V Temperature from –40°C to +140°C, unless otherwise noted Num C Rating Symbol Min Typ Max Unit 1 P Input high voltage VIH 1.75 — — V 2 P Input low voltage VIL — — 0.75 V 3 C Input hysteresis VHYS — 100 — mV |
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