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STM32F217VG Datasheet(PDF) 101 Page - STMicroelectronics |
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STM32F217VG Datasheet(HTML) 101 Page - STMicroelectronics |
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101 / 175 page ![]() DocID17050 Rev 9 101/175 STM32F21xxx Electrical characteristics 174 Static latch-up Two complementary static tests are required on six parts to assess the latch-up performance: • A supply overvoltage is applied to each power supply pin • A current injection is applied to each input, output and configurable I/O pin These tests are compliant with EIA/JESD 78A IC latch-up standard. 6.3.15 I/O current injection characteristics As a general rule, current injection to the I/O pins, due to external voltage below VSS or above VDD (for standard, 3 V-capable I/O pins) should be avoided during normal product operation. However, in order to give an indication of the robustness of the microcontroller in cases when abnormal injection accidentally happens, susceptibility tests are performed on a sample basis during device characterization. Functional susceptibilty to I/O current injection While a simple application is executed on the device, the device is stressed by injecting current into the I/O pins programmed in floating input mode. While current is injected into the I/O pin, one at a time, the device is checked for functional failures. The failure is indicated by an out of range parameter: ADC error above a certain limit (>5 LSB TUE), out of spec current injection on adjacent pins or other functional failure (for example reset, oscillator frequency deviation). The test results are given in Table 44. Table 43. Electrical sensitivities Symbol Parameter Conditions Class LU Static latch-up class TA = +105 °C conforming to JESD78A II level A Table 44. I/O current injection susceptibility Symbol Description Functional susceptibility Unit Negative injection Positive injection IINJ Injected current on all FT pins –5 +0 mA Injected current on any other pin –5 +5 |
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