STM32L052R8 datasheet(131/136 Pages) STMICROELECTRONICS

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STM32L052x6 STM32L052x8

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Revision history

Table 91. Document revision history

Date

Revision

Changes

27-Feb-2014

Initial release.

29-Apr-2014

Added WLCSP36 package.

Updated Table 2: Ultra-low-power STM32L052x6/x8 device features

and peripheral counts

Updated Figure 4: STM32L052x6/8 TFBGA64 ballout - 5x 5 mm.

Updated Table 5: Functionalities depending on the working mode (from

Run/active down to standby). Added Section 3.2: Interconnect matrix.

Replaced TTa I/O structure by TC, updated PA0/4/5, PC5/14, BOOT0

and NRST I/O structure, and added note 3. in Table 16:

STM32L052x6/8 pin definitions.

Updated Table 25: General operating conditions, Table 22: Voltage

characteristics and Table 23: Current characteristics.

Modified conditions in Table 28: Embedded internal reference voltage.

Updated Table 29: Current consumption in Run mode, code with data

processing running from Flash, Table 31: Current consumption in Run

mode, code with data processing running from RAM, Table 33: Current

consumption in Sleep mode, Table 34: Current consumption in Low-

power run mode, Table 35: Current consumption in Low-power sleep

mode, and Table 36: Typical and maximum current consumptions in

Stop modeTable 37: Typical and maximum current consumptions in

Standby mode. Added Figure 14: IDD vs VDD, at TA= 25/55/85/105 °C,

Run mode, code running from Flash memory, Range 2, HSE, 1WS,

Figure 15: IDD vs VDD, at TA= 25/55/85/105 °C, Run mode, code

running from Flash memory, Range 2, HSI16, 1WS, Figure 16: IDD vs

VDD, at TA= 25/55/ 85/105/125 °C, Low-power run mode, code running

from RAM, Range 3, MSI (Range 0) at 64 KHz, 0 WS, Figure 17: IDD

vs VDD, at TA= 25/55/ 85/105/125 °C, Stop mode with RTC enabled

and running on LSE Low drive and Figure 18: IDD vs VDD, at TA=

25/55/85/105/125 °C, Stop mode with RTC disabled, all clocks off.

Updated Table 44: HSE oscillator characteristics and Table 45: LSE

oscillator characteristics. Added Figure 23: HSI16 minimum and

maximum value versus temperature.

Updated Table 56: ESD absolute maximum ratings, Table 58: I/O

current injection susceptibility and Table 59: I/O static characteristics,

and added Figure 24: VIH/VIL versus VDD (CMOS I/Os) and Figure 25:

VIH/VIL versus VDD (TTL I/Os). Updated Table 60: Output voltage

characteristics, Table 61: I/O AC characteristics, and Figure 26: I/O AC

characteristics definition.

Updated Table 63: ADC characteristics, Table 65: ADC accuracy, and

Figure 29: Typical connection diagram using the ADC. Updated

Table 68: Temperature sensor characteristics.

Updated Table 74: SPI characteristics in voltage Range 1 and Table 77:

I2S characteristics.

Added Figure 56: Thermal resistance.

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