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74LVC1G32 Datasheet (PDF) - Nexperia B.V. All rights reserved

74LVC1G32 Datasheet PDF - Nexperia B.V. All rights reserved
Part # 74LVC1G32
Download  74LVC1G32 Download
File Size   255.33 Kbytes
Page   16 Pages
Manufacturer  NEXPERIA [Nexperia B.V. All rights reserved]
Direct Link  https://www.nexperia.com/
Logo NEXPERIA - Nexperia B.V. All rights reserved
Description Single 2-input OR gate

74LVC1G32 Datasheet (PDF)

Go To PDF Page Download Datasheet
74LVC1G32 Datasheet PDF - Nexperia B.V. All rights reserved

Part # 74LVC1G32
Download  74LVC1G32 Click to download

File Size   255.33 Kbytes
Page   16 Pages
Manufacturer  NEXPERIA [Nexperia B.V. All rights reserved]
Direct Link  https://www.nexperia.com/
Logo NEXPERIA - Nexperia B.V. All rights reserved
Description Single 2-input OR gate

74LVC1G32 Datasheet (HTML) - Nexperia B.V. All rights reserved


74LVC1G32 Product details

1. General description
The 74LVC1G32 is a single 2-input OR gate. Inputs can be driven from either 3.3 V or 5 V devices.
This feature allows the use of these devices as translators in mixed 3.3 V and 5 V environments.
Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and fall times. This
device is fully specified for partial power down applications using IOFF. The IOFF circuitry disables
the output, preventing the potentially damaging backflow current through the device when it is
powered down.
2. Features and benefits
• Wide supply voltage range from 1.65 V to 5.5 V
• Overvoltage tolerant inputs to 5.5 V
• High noise immunity
• CMOS low power dissipation
• IOFF circuitry provides partial Power-down mode operation
• ±24 mA output drive (VCC = 3.0 V)
• Latch-up performance exceeds 250 mA
• Direct interface with TTL levels
• Complies with JEDEC standard:
• JESD8-7 (1.65 V to 1.95 V)
• JESD8-5 (2.3 V to 2.7 V)
• JESD8-B/JESD36 (2.7 V to 3.6 V)
• ESD protection:
• HBM JESD22-A114F exceeds 2000 V
• MM JESD22-A115-A exceeds 200 V
• Multiple package options
• Specified from -40 °C to +85 °C and -40 °C to +125 °C.




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