1 Features
• Vendor item drawing available, VID V62/23616
• Total ionizing dose characterized at 30 krad(Si)
– Total ionizing dose characterized radiation lot
acceptance testing (TID RLAT) for every wafer
lot to 30 krad(Si)
• Single-event effects (SEE) characterized:
– Single event latch-up (SEL) immune to linear
energy transfer (LET) = 43 MeV-cm2 /mg
– Single event transient (SET) characterized to
43 MeV-cm2 /mg
• Wide operating range of 1.2 V to 5.5 V
• 5.5 V tolerant input pins
• Output drive up to 25 mA at 5-V
• Latch-up performance exceeds 250 mA per
JESD 17
• Space enhanced plastic (SEP)
– Controlled baseline
– Gold bondwire
– NiPdAu lead finish
– One assembly and test site
– One fabrication site
– Military (–55°C to 125°C) temperature range
– Extended product life cycle
– Product traceability
– Meets NASAs ASTM E595 outgassing
specification

2 Applications
• Enable or Disable a Digital Signal
• Eliminate Slow or Noisy Input Signals
• Hold a Signal During Controller Reset
• Debounce a Switch

3 Description
SN54SC245-SEP is an octal bus transceiver with 3-
state outputs. All eight channels are controlled by
the direction (DIR) pin and output enable (OE) pin.
The output enable (OE) controls all outputs in the
device. When the OE pin is in the low state, the
appropriate outputs as determined by the direction
DIR) pin are enabled. When the OE pin is in the
high state, all outputs of the device are disabled. All
disabled outputs are placed into the high-impedance
state.