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LTM4622EY Datasheet(PDF) 16 Page - Linear Technology |
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LTM4622EY Datasheet(HTML) 16 Page - Linear Technology |
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16 / 28 page ![]() LTM4622 16 Rev F For more information www.analog.com APPLICATIONS INFORMATION A graphical representation of the aforementioned ther- mal resistances is given in Figure 7; blue resistances are contained within the μModule regulator, whereas green resistances are external to the µModule. As a practical matter, it should be clear to the reader that no individual or sub-group of the four thermal resistance parameters defined by JESD 51-12 or provided in the Pin Configuration section replicates or conveys normal operating conditions of a μModule. For example, in nor- mal board-mounted applications, never does 100% of the device’s total power loss (heat) thermally conduct exclusively through the top or exclusively through bottom of the µModule—as the standard defines for θJCtop and θJCbottom, respectively. In practice, power loss is ther- mally dissipated in both directions away from the pack- age—granted, in the absence of a heat sink and airflow, a majority of the heat flow is into the board. Within a SIP (system-in-package) module, be aware there are multiple power devices and components dissipating power, with a consequence that the thermal resistances relative to different junctions of components or die are not exactly linear with respect to total package power loss. To reconcile this complication without sacrificing modeling simplicity—but also, not ignoring practical realities—an approach has been taken using FEA software modeling along with laboratory testing in a controlled-environment chamber to reasonably define and correlate the thermal resistance values supplied in this data sheet: (1) Initially, FEA software is used to accurately build the mechanical geometry of the µModule and the specified PCB with all of the correct material coefficients along with accurate power loss source definitions; (2) this model simulates a software-defined JEDEC environment consistent with JSED51-12 to predict power loss heat flow and tempera- ture readings at different interfaces that enable the cal- culation of the JEDEC-defined thermal resistance values; (3) the model and FEA software is used to evaluate the µModule with heat sink and airflow; (4) having solved for and analyzed these thermal resistance values and simulated various operating conditions in the software model, a thorough laboratory evaluation replicates the simulated conditions with thermo-couples within a con- trolled-environment chamber while operating the device at the same power loss as that which was simulated. An outcome of this process and due-diligence yields a set of derating curves provided in other sections of this data sheet. After these laboratory test have been performed and correlated to the µModule model, then the θJB and θBA are summed together to correlate quite well with the µModule model with no airflow or heat sinking in a prop- erly define chamber. This θJB + θBA value is shown in the Pin Configuration section and should accurately equal the θJA value because approximately 100% of power loss Figure 8. 1V Output Power Loss Figure 9. 1.5V Output Power Loss Figure 10. 2.5V Output Power Loss OUTPUT CURRENT (A) 0 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0 3 4622 F08 1 2 4 5 12VIN 5VIN OUTPUT CURRENT (A) 0 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0 3 4622 F09 1 2 4 5 12VIN 5VIN OUTPUT CURRENT (A) 0 2.5 2.0 1.5 1.0 0.5 0 3 4622 F10 1 2 4 5 12VIN 5VIN |
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