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CAT9554WI-GT2 Datasheet(PDF) 2 Page - ON Semiconductor

Part # CAT9554WI-GT2
Description  8-bit I2C and SMBus I/O Port
PDF  14 Pages
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

CAT9554WI-GT2 Datasheet(HTML) 2 Page - ON Semiconductor

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CAT9554, CAT9554A
http://onsemi.com
2
Figure 1. Block Diagram
8−BIT
WRITE pulse
READ pulse
LP FILTER
POWER−ON
RESET
INPUT
FILTER
CONTROL
A0
A1
A2
SDA
SCL
INPUT/
OUTPUT
PORTS
INT
VCC
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
I/O6
I/O7
I2C/SMBUS
VCC
VSS
Note: All I/Os are set to inputs at RESET.
Table 1. PIN DESCRIPTION
SOIC / TSSOP
TQFN
Pin Name
Function
1
15
A0
Address Input 0
2
16
A1
Address Input 1
3
1
A2
Address Input 2
4−7
2−5
I/O0−3
Input/Output Port 0 to Input/Output Port 3
8
6
VSS
Ground
9−12
7−10
I/O4−7
Input/Output Port 4 to Input/Output Port 7
13
11
INT
Interrupt Output (open drain)
14
12
SCL
Serial Clock
15
13
SDA
Serial Data
16
14
VCC
Power Supply
Table 2. ABSOLUTE MAXIMUM RATINGS
Parameters
Ratings
Units
VCC with Respect to Ground
−0.5 to +6.5
V
Voltage on Any Pin with Respect to Ground
−0.5 to +5.5
V
DC Current on I/O0 to I/O7
±50
mA
DC Input Current
±20
mA
VCC Supply Current
85
mA
VSS Supply Current
100
mA
Package Power Dissipation Capability (TA = 25°C)
1.0
W
Junction Temperature
+150
°C
Storage Temperature
−65 to +150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
Table 3. RELIABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Units
VZAP (Note 2)
ESD Susceptibility
JEDEC Standard JESD 22
2000
Volts
ILTH (Notes 2, 3)
Latch−up
JEDEC Standard 17
100
mA
2. This parameter is tested initially and after a design or process change that affects the parameter.
3. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC +1 V.



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