Active Scanning Technology

Magnetic force generates uniform small measuring force, which is applied in

the workpiece normal direction. Because of this, stylus deflection is minimized

and uniform, and accuracy is improved.

Since a mechanical spring is used, measuring force is uneven, stylus deflec-

tion fluctuates, and accuracy cannot be improved.

Active Scanning System

Passive Scanning System

VAST Technology: Active

With measuring force control

Conventional system: Passive

Without measuring force control

7

TOKYO SEIMITSU

Outstanding actual accuracy comparable

to high-end machine

1.6 + 3L/1000 μm* with the actual value as small as ±1 μm

*It is the accuracy of the size of the 9/10/6 below.

Stylus Deflection

Compensation

Displacement

Displacement

Displacement

Displacement

Stylus Deflection

Some workpieces cannot be measured without the active scanning technology

The active scanning system is highly appreciated with many application track records, such as measurement of high-precision

workpieces that require coaxiality, concentricity, flatness or straightness, evaluation of free-form surface of precision dies,

high-precision measurement of deep holes that require long stylus, circumference measurement of tapered parts that requires

scanning measurement, evaluation of V grooves, ball screw grooves and rack grooves and high-precision geometrical evaluation.

Incorporates active scanning probe VAST

XT gold as a standard feature

The active scanning probe enables high-accuracy measure-

ment of areas that were previously difficult to measure, because

it can be fitted with a long and heavy stylus.

Also, as the measuring pressure is controllable, probe deflection

can be accurately eliminated.

These features make it the only one probe system capable of

quick and accurate measurement of not only known forms but

also unknown forms.

our previous machine (specification)

Maximum Permissible

Actual measure

max. 500 mm

Maximum probe length

Maximum probe weight

Minimum probe diameter