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ADRF5721BCCZN-R7 Datasheet(PDF) 14 Page - Analog Devices

Part # ADRF5721BCCZN-R7
Description  Silicon Digital Attenuator
PDF  17 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADRF5721BCCZN-R7 Datasheet(HTML) 14 Page - Analog Devices

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ADRF5721
Data Sheet
Rev. 0 | Page 14 of 17
APPLICATIONS INFORMATION
EVALUATION BOARD
The ADRF5721-EVALZ is a 4-layer evaluation board. The top
and bottom copper layer are 0.5 oz (0.7 mil) plated to 1.5 oz
(2.2 mil) and are separated by dielectric materials. The stackup
for this evaluation board is shown in Figure 27.
Figure 27. Evaluation Board Stackup, Cross Sectional View
All RF and dc traces are routed on the top copper layer, whereas
the inner and bottom layers are grounded planes that provide a
solid ground for the RF transmission lines. The top dielectric
material is 12 mil Rogers RO4003, offering optimal high
frequency performance. The middle and bottom dielectric
materials provide mechanical strength. The overall board
thickness is 62 mil, which allows 2.4 mm RF launchers to be
connected at the board edges.
The RF transmission lines are designed using a coplanar
waveguide (CPWG) model, with a trace width of 16 mil and
ground clearance of 6 mil to have a characteristic impedance of
50 Ω. For optimal RF and thermal grounding, as many through
vias as possible are arranged around transmission lines and
under the exposed pad of the package.
Thru calibration can be used to calibrate out the board loss effects
from the ADRF5721-EVALZ evaluation board measurements to
determine the device performance at the pins of the IC. Figure 28
shows the typical board loss (THRU) for the ADRF5721-EVALZ
evaluation board at room temperature, the embedded insertion
loss, and the de-embedded insertion loss for the ADRF5721.
Figure 28. Insertion Loss vs. Frequency
Figure 29 shows the actual ADRF5721-EVALZ evaluation board
with component placement.
Figure 29. Evaluation Board Layout, Top View
Two power supply ports are connected to the VDD and VSS test
points, TP1 and TP2, and the ground reference is connected to
the GND test point, TP4. On the supply traces, VDD and VSS,
use a 100 pF bypass capacitor to filter high frequency noise.
Additionally, unpopulated components positions are available
for applying extra bypass capacitors.
All the digital control pins are connected through digital signal
traces to the 2 × 9-pin header, P1. There are provisions for a
resistor capacitor (RC) filter that helps eliminate dc-coupled
noise. The ADRF5721 was evaluated without an external RC
filter, the series resistors are 0 Ω, and shunt capacitors are
unpopulated on the evaluation board.
The RF input and output ports (ATTIN and ATTOUT) are
connected through 50 Ω transmission lines to the 2.4 mm RF
launchers, J1 and J2, respectively. These high frequency RF
launchers are connected by contact and are not soldered onto
the board.
A thru calibration line connects the unpopulated J3 and J4
launchers. This transmission line is used to estimate the loss of
the PCB over the environmental conditions being evaluated.
The schematic of the ADRF5721-EVALZ evaluation board is
shown in Figure 30.
RO4003
1.5oz Cu (2.2mil)
1.5oz Cu (2.2mil)
0.5oz Cu (0.7mil)
0.5oz Cu (0.7mil)
1.5oz Cu (2.2mil)
1.5oz Cu (2.2mil)
W = 16mil
G = 6mil
T = 2.2mil
H = 12mil
–10
–9
–8
–7
–6
–5
–4
–3
–2
–1
0
0
5
10
15
20
25
30
35
40
45
FREQUENCY (GHz)
THRU LOSS
DE-EMBEDDED INSERTION LOSS
EMBEDDED INSERTION LOSS



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