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ADGM1004JCPZ-R2 Datasheet(PDF) 30 Page - Analog Devices |
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ADGM1004JCPZ-R2 Datasheet(HTML) 30 Page - Analog Devices |
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30 / 32 page ![]() ADGM1004 Data Sheet Rev. D | Page 30 of 32 Mechanical Shock Precautions The ADGM1004 passes extensive mechanical shock qualification tests, as described in Table 8. These tests validate the robustness of the device when exposed to normal mechanical shocks. Table 8. Mechanical Qualification Summary Parameter Qualification Mechanical Shock Powered (PMS) IEC 60068-2-27 Random Drop AEC-Q100 Test G5, five drops from 0.6 m Vibration Testing MIL-STD-883, M2007.3, Condition B, 20 Hz to 2000 Hz at 50 g Group D, Sub 4, MIL- STD-883, M5005 Mechanical shock, 1500 g, 0.5 ms; vibration 50 g sine sweep, 20 Hz to 2000 Hz; acceleration 30,000 g Do not use the ADGM1004 if dropped. Ensure minimal mechanical shocks during the handling and manufacturing of the device. Figure 62 shows examples of loose device handling situations to avoid for risk of mechanical shock and ESD events. NOT RECOMMENDED DEVICES STORED BULK IN BINS DEVICE DROPPED DEVICES DUMPED OUT ON BENCHTOP Figure 62. Situations to Avoid During Handling |
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