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RE46C180 Datasheet(PDF) 22 Page - Microchip Technology |
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RE46C180 Datasheet(HTML) 22 Page - Microchip Technology |
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22 / 58 page ![]() RE46C180 DS20002275C-page 22 2011-2021 Microchip Technology Inc. 4.3 Serial Read/Write Calibration As an alternative to the steps in Section 4.2, Smoke Calibration, the sensitivity settings can be entered directly from a Serial Read/Write Calibration mode (if the system has been well characterized). To enter this mode, follow these steps: 1. Power-up with the bias condition shown in Figure 4-1 to enter M0. At power-up: TEST = IO = FEED = T2 = VSS, DETECT = VDD, 2. Drive T2 input from VSS to VDD and hold at VDD to enter TM0. 3. Drive TEST from VSS to VDD and hold at VDD. 4. Apply 10 clock pulses to the T2 input (VDD to VSS and back to VDD) to enter in TM10 mode. This enables the Serial Read/Write Calibration mode. 5. TEST now acts as a data input (High = VDD, Low = VSS). FEED acts as the clock input (High = VDD, Low = VSS). Clock in the sensitivity settings. The data sequence should be as follows: 6. After all 17 bits have been entered, pulse IO to store into the EEPROM memory. Power-down the part to take effect. 5 bit Standby Sensitivity (LSB first) 3 bit Hysteresis (LSB first) 4 bit HUSH Sensitivity (LSB first) 5 bit CHAMBER voltage in PTT/Chamber Test (LSB first) |
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