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MB89537APF Datasheet(PDF) 21 Page - fujitsu semiconductor |
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MB89537APF Datasheet(HTML) 21 Page - fujitsu semiconductor |
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21 / 62 page ![]() MB89530A Series 21 •••• Recommended screening conditions Before one-time writing of microcontroller programs to PROM, high temperature aging is recommended as a screening process for chips before they are mounted. •••• About writing yields The nature of chips before one-time writing of microcontroller programs to PROM prevents the use of all-bit writing tests. Therefore it is not possible to guarantee writing yields of 100% in some cases. Program, verify High temperature aging +150 °C, 48 h Read Mount |
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