Electronic Components Datasheet Search
  New Zealand  ▼
ALLDATASHEET.CO.NZ

X  

STM32L072X8 Datasheet(PDF) 93 Page - STMicroelectronics

Part # STM32L072X8
Description  Ultra-low-power 32-bit MCU Arm®-based Cortex®-M0, up to 192KB Flash, 20KB SRAM, 6KB EEPROM, USB, ADC, DACs
PDF  160 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32L072X8 Datasheet(HTML) 93 Page - STMicroelectronics

Back Button STM32L072X8 Datasheet HTML 89Page - STMicroelectronics STM32L072X8 Datasheet HTML 90Page - STMicroelectronics STM32L072X8 Datasheet HTML 91Page - STMicroelectronics STM32L072X8 Datasheet HTML 92Page - STMicroelectronics STM32L072X8 Datasheet HTML 93Page - STMicroelectronics STM32L072X8 Datasheet HTML 94Page - STMicroelectronics STM32L072X8 Datasheet HTML 95Page - STMicroelectronics STM32L072X8 Datasheet HTML 96Page - STMicroelectronics STM32L072X8 Datasheet HTML 97Page - STMicroelectronics Next Button
Zoom Inzoom in Zoom Outzoom out
 93 / 160 page
background image
DS10689 Rev 5
93/160
STM32L072xx
Electrical characteristics
122
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
•
Corrupted program counter
•
Unexpected reset
•
Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
Table 56. EMI characteristics
Symbol Parameter
Conditions
Monitored
frequency band
Max vs.
frequency
range at
32 MHz
Unit
SEMI
Peak level
VDD = 3.6 V,
TA = 25 °C,
LQFP100 package
compliant with IEC 61967-2
0.1 to 30 MHz
-7
dBµV
30 to 130 MHz
14
130 MHz to 1 GHz
9
EMI Level
2
-



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


Datasheet Download

Go To PDF Page


Link URL



Does ALLDATASHEET help your business so far?  [ DONATE ] 

About Alldatasheet   |   Advertisement   |   Contact us   |   Privacy Policy   |   Link to Datasheet    |   Link Exchange   |   Manufacturer List
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com