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STB30N65DM6AG Datasheet(PDF) 4 Page - STMicroelectronics |
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STB30N65DM6AG Datasheet(HTML) 4 Page - STMicroelectronics |
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4 / 15 page ![]() Table 7. Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 28 A ISDM(1) Source-drain current (pulsed) - 112 A VSD(2) Forward on voltage ISD = 28 A, VGS = 0 V - 1.6 V trr Reverse recovery time ISD = 28 A, di/dt = 100 A/µs, VDD = 60 V (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 126 ns Qrr Reverse recovery charge - 0.63 µC IRRM Reverse recovery current - 10 A trr Reverse recovery time ISD = 28 A, di/dt = 100 A/µs, VDD = 60 V, TJ = 150 °C (see Figure 15. Test circuit for inductive load switching and diode recovery times) - 220 ns Qrr Reverse recovery charge - 2.1 µC IRRM Reverse recovery current - 19 A 1. Pulse width limited by safe operating area. 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5%. STB30N65DM6AG Electrical characteristics DS13770 - Rev 1 page 4/15 |
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