STM32L051C8 datasheet(76/133 Pages) STMICROELECTRONICS

Part #	STM32L051C8

Description	Access line ultra-low-power 32-bit MCU Arm®-based Cortex®-M0, up to 64 KB Flash, 8 KB SRAM, 2 KB EEPROM, ADC

PDF	133 Pages

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Manufacturer	STMICROELECTRONICS [STMicroelectronics]

Direct Link	http://www.st.com

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Electrical characteristics

STM32L051x6 STM32L051x8

76/133

DS10184 Rev 10

To complete these trials, ESD stress can be applied directly on the device, over the range of

specification values. When unexpected behavior is detected, the software can be hardened

to prevent unrecoverable errors occurring (see application note AN1015).

Electromagnetic Interference (EMI)

The electromagnetic field emitted by the device are monitored while a simple application is

executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with

IEC 61967-2 standard which specifies the test board and the pin loading.

Table 50. EMI characteristics

Symbol Parameter

Conditions

Monitored

frequency band

Max vs. fosc/fCPU

Unit

8 MHz/

4 MHz

8 MHz/

16 MHz

8 MHz/

32 MHz

SEMI

Peak level

VDD = 3.6 V,

TA = 25 °C,

compliant with IEC

61967-2

0.1 to 30 MHz

-21

-15

-12

dBµV

30 to 130 MHz

-14

-12

-1

130 MHz to 1GHz

-10

-11

-7

EMI Level

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