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STM32L031C6 Datasheet(PDF) 27 Page - STMicroelectronics

Part # STM32L031C6
Description  Access line ultra-low-power 32-bit MCU Arm®-based Cortex®-M0, up to 32KB Flash, 8KB SRAM, 1KB EEPROM, ADC
PDF  126 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32L031C6 Datasheet(HTML) 27 Page - STMicroelectronics

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DS10668 Rev 6
27/126
STM32L031x4/6
Functional overview
33
3.11
Analog-to-digital converter (ADC)
A native 12-bit, extended to 16-bit through hardware oversampling, analog-to-digital
converter is embedded into STM32L031x4/6 devices. It has up to 10 external channels and
3 internal channels (temperature sensor, voltage reference). Three channel are fast
channel, PA0, PA4 and PA5, while the others are standard channels.
It performs conversions in single-shot or scan mode. In scan mode, automatic conversion is
performed on a selected group of analog inputs.
The ADC frequency is independent from the CPU frequency, allowing maximum sampling
rate of 1.14 Msps even with a low CPU speed. The ADC consumption is low at all
frequencies (~25 µA at 10 kSPS, ~200 µA at 1 Msps). An auto-shutdown function
guarantees that the ADC is powered off except during the active conversion phase.
The ADC can be served by the DMA controller. It can operate from a supply voltage down to
1.65 V.
The ADC features a hardware oversampler up to 256 samples, this improves the resolution
to 16 bits (see AN2668).
An analog watchdog feature allows very precise monitoring of the converted voltage of one,
some or all scanned channels. An interrupt is generated when the converted voltage is
outside the programmed thresholds.
The events generated by the general-purpose timers (TIMx) can be internally connected to
the ADC start triggers, to allow the application to synchronize A/D conversions and timers.
3.12
Temperature sensor
The temperature sensor (TSENSE) generates a voltage VSENSE that varies linearly with
temperature.
The temperature sensor is internally connected to the ADC_IN18 input channel which is
used to convert the sensor output voltage into a digital value.
The sensor provides good linearity but it has to be calibrated to obtain good overall
accuracy of the temperature measurement. As the offset of the temperature sensor varies
from chip to chip due to process variation, the uncalibrated internal temperature sensor is
suitable for applications that detect temperature changes only.
To improve the accuracy of the temperature sensor measurement, each device is
individually factory-calibrated by ST. The temperature sensor factory calibration data are
stored by ST in the system memory area, accessible in read-only mode.
Table 7. Temperature sensor calibration values
Calibration value name
Description
Memory address
TSENSE_CAL1
TS ADC raw data acquired at
temperature of 30 °C, VDDA= 3 V
0x1FF8 007A - 0x1FF8 007B
TSENSE_CAL2
TS ADC raw data acquired at
temperature of 130 °C, VDDA= 3 V
0x1FF8 007E - 0x1FF8 007F



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