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FXLS8967AF Datasheet(PDF) 8 Page - NXP Semiconductors |
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FXLS8967AF Datasheet(HTML) 8 Page - NXP Semiconductors |
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8 / 98 page  NXP Semiconductors FXLS8967AF 3-Axis Low-g Accelerometer VDD = 1.8 V to 3.0 V, T = –40 °C to 105 °C, unless otherwise noted. Typical values represent mean or mean ±1 σ values, depending on the specific parameter. Symbol Parameter Conditions Min Typ Max Unit ±2 g mode 0.87 0.98 1.12 ±4 g mode 1.74 1.95 2.23 ±8 g mode 3.47 3.91 4.46 ±16 g mode 6.94 7.81 8.93 mg/LSB ±2 g mode 896 1024 1152 ±4 g mode 448 512 576 ±8 g mode 224 256 288 SEN Nominal sensitivity ±16 g mode 112 128 144 LSB/g SENTOL Sensitivity tolerance[1] — — ±2.5 — %SEN TCS Temperature coefficient of sensitivity[1] –40 °C to +105 °C — ±0.01 — %/°C XY axes –200 ±50 200 OFFPBM Zero-g offset, post-board mount, FSR ≤ ±8g[1][2] Z axis –550 ±150 550 mg XY axes — 0.55 — TCOPBM Zero-g offset temperature coefficient, post-board mount[1] Z axis — 0.8 — mg/°C CAS Cross-axis sensitivity[3] ±2/4 g mode — ±0.5 — % ±4 g mode, X axis –206 –139 –81 ±4 g mode, Y axis 78 137 207 ±4 g mode, Z axis –727 –448 –120 ±8 g mode, X axis –103 –69 –40 ±8 g mode, Y axis 38 68 103 ±8 g mode, Z axis –355 –223 –71 ±16 g mode, X axis –52 –35 –19 ±16 g mode, Y axis 19 34 52 STOC Self-test output change[4] ±16 g mode, Z axis –178 -112 –35 LSB ±4 g mode –1600 — +1600 ±8 g mode –800 — +800 STOF Self-test offset[4] ±16 g mode –400 — +400 LSB BWMAX Maximum signal bandwidth ODR = 3200 Hz — 1600 — Hz ODRMAX Maximum ODR — — 3200 — Hz XY axes — 217 — NSDHPM Noise Spectral Density, High Performance Mode, FSR ≤ ±4 g, 25 Hz ≤ ODR ≤ 3200 Hz Z axis — 257 — µg/ ⎷Hz XY axes — 7.8 — NRMSLPM Noise RMS, Low-Power Mode, FSR ≤ ±4 g, all ODR ranges[5] Z axis — 9.4 — mg Table 7. Accelerometer sensor performance parameters...continued FXLS8967AF All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Preliminary data sheet Rev. 1.3 — 22 October 2021 8 / 98 |
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