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ZSSC3281BC3R Datasheet(PDF) 32 Page - Renesas Technology Corp

Part # ZSSC3281BC3R
Description  Advanced Dual Channel ARM based Resistive Sensor Signal Conditioner IC
PDF  102 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

ZSSC3281BC3R Datasheet(HTML) 32 Page - Renesas Technology Corp

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ZSSC3281 Datasheet
R33DS0020ED0100 Rev. 1.0
Jun.13.22
Page 32
© 2022 Renesas Electronics
Because most sensor applications also require other auxiliary measurements, the assignment of the AZ
measurement to the group of auxiliary measurements helps to reduce the worst case measurement latency on the
main bridge sensor. This is because the SM- slot as needed in configuration of Figure 21, can be omitted.
The lowest measurement latency is achieved with
the “SM- only” configuration in Figure 23. However, this is only
true if no other auxiliary measurements are needed for the desired sensor application.
A further influence on the overall measurement time has the input settling time, which is required depending on
the output resistance of the external sensors, respective capacitive loads on the signal lines and the ADC
resolution selected by the user. The input settling time is always inserted before an ADC conversion starts and
can be configured in the GUI for main bridge measurements via Configure\AFE\Bridge\SetTime[µs] and for
auxiliary temperature measurements via Configure\AFE\Temperature\SetTime[µs].
Considering achievable measurement latencies and noise performance, configuration in Figure 21 is better when
higher ADC resolutions are required or for sensor configurations with fast input settling, while configuration in
Figure 22 and Figure 23 are preferable when lower ADC resolutions become selected or for sensor configurations
requiring long input settling times (bridge settling time has a considerable impact on the timing budget).
4.6.2.
Auxiliary Measurement Configuration
The supported auxiliary measurements are:
Auto-zero for internal signal path
Temperature on sensor input T1
Temperature on sensor input T2
Temperature on sensor input T3
Internal PTAT
AFE diagnostic checks
o
Sensor connection checks for all external sensors (Short to TOPx pin or BOTx pin and Open)
o
Bridge sensor leakage to VSS in Thermocouple/Thermopile operation mode of the AFE
o
Bridge signal range check
o
AFE gain and offset drift supervision via internal reference DAC
They can be activated in the GUI via tabs Configure\AFE\Sequencer, Configure\AFE\Temperature Selection and
Diagnostic\Sensor/AFE.
4.6.3.
Deterministic Input Step Response with SM+/SM- Configuration
As described in section 4.6.1, sensor configurations with fast input settling or applications requiring higher ADC
resolutions are better served with the SM+/SM- scheme for the main bridge measurement. For the following step
response consideration, the below application example is used:
Sensor Measurement (non-inverted)
Sensor Measurement (inverted)
Auxiliary Measurement (e.g. for sensor temperature)
Note: SM+ and SM- can be exchanged yielding to the same result
SM+
aux i
SM -
SM+
aux i
SM -
standard config
Figure 24: SM+/SM- Configuration
The worst-case input to output latency consists of:
4 sensor A2D-conversion times (duration depending on selected ADC resolution)
1 auxiliary conversion time (fixed duration, based on longest auxiliary conversion timing)
1 SSC calculation



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