NE555/SA555/NA555

Document number: DS35112 Rev. 5 - 2

4 of 14

www.diodes.com

February 2021

© Diodes Incorporated

NE555

Electrical Characteristics (VCC = 5V to 15V, TA = 25°C unless otherwise stated)

Symbol

Parameter

Test conditions

Min

Typ.

Max

Unit

VOL

Low level output voltage

VCC = 15V, IOL = 10mA

—

0.1

0.25

V

VCC = 15V, IOL = 50mA

—

0.4

0.75

VCC = 15V, IOL = 100mA

—

2

2.5

VCC = 15V, IOL = 200mA

—

2.5

—

VCC = 5V, IOL = 5mA

—

0.1

0.35

VCC = 5V, IOL = 8mA

—

0.15

0.4

VOH

High level output voltage

VCC = 15V, IOH = -100mA

12.75

13.3

—

V

VCC = 15V, IOH = -200mA

—

12.5

—

VCC = 5V, IOH = -100mA

2.75

3.3

—

ICC

Supply current

Output low, no load

VCC = 15V

—

10

15

mA

VCC = 5V

—

3

6

Output high, no load

VCC = 15V

—

9

13

VCC = 5V

—

2

5

TER

Initial error of timing interval

(Note 10)

Each time, monostable

(Note 11)

—

—

1

3

%

Each time, astable

(Note 12)

—

2.25

—

TTC

Temperature coefficient of timing

interval

Each time, monostable

(Note 11)

TA = full range

—

50

—

ppm/°C

Each time, astable

(Note 12)

—

150

—

TVCC

Supply voltage sensitivity of timing

interval

Each time, monostable

(Note 11)

—

—

0.1

0.5

%/V

Each time, astable

(Note 12)

—

0.3

—

TRI

Output pulse rise time

CL = 15pF

—

—

300

ns

TFA

Output pulse fall time

CL = 15pF

—

—

300

ns

Notes:

10. Timing interval error is defined as the difference between the measured value and the average value of a random sample from each process run.

11. Values specified are for a device in a monostable circuit similar to Figure 9, with the following component values: RA = 2kΩ to 100kΩ, C = 0.1uF.

12. Values specified are for a device in an astable circuit similar to Figure 12, with the following component values: RA = 1kΩ to 100kΩ, C = 0.1uF.