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TPCP8513 Datasheet(PDF) 2 Page - Toshiba Semiconductor

Part # TPCP8513
Description  Bipolar Transistors Silicon NPN Epitaxial Type
PDF  7 Pages
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Manufacturer  TOSHIBA [Toshiba Semiconductor]
Direct Link  http://www.semicon.toshiba.co.jp/eng
Logo TOSHIBA - Toshiba Semiconductor

TPCP8513 Datasheet(HTML) 2 Page - Toshiba Semiconductor

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TPCP8513
2
4. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 �)
Characteristics
Collector-base voltage
Collector-emitter voltage
Emitter-base voltage
Collector current (DC)
Collector current (pulsed)
Base current
Collector power dissipation
Collector power dissipation
Junction temperature
Storage temperature
(Note 1)
(Note 1)
(Note 2)
(Note 3)
Symbol
VCBO
VCEX
VCEO
VEBO
IC
ICP
IB
PC
Tj
Tstg
Rating
160
140
80
7
4
8
0.4
1.0
2.0
150
-55 to 150
Unit
V
V
V
A
A
W
�
�
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Ensure that the junction temperature does not exceed 150 �.
Note 2: Device mounted on a 25.4 mm × 25.4 mm × 1.6 mm FR-4 glass epoxy board (with a dissipating copper surface
of 645 mm2)
Note 3: Device mounted on a 40.0 mm × 40.0 mm × 0.8 mm ceramic board (with a dissipating copper surface of 1600
mm2)
5. Electrical Characteristics
5.1. Static Characteristics (Unless otherwise specified, Ta = 25 �)
Characteristics
Collector cut-off current
Emitter cut-off current
Collector-emitter breakdown voltage
DC current gain
Collector-emitter saturation voltage
Base-emitter saturation voltage
Symbol
ICBO
IEBO
V(BR)CEO
hFE(1)
hFE(2)
VCE(sat)(1)
VCE(sat)(2)
VBE(sat)
Test Condition
VCB = 160 V, IE = 0 A
VEB = 7 V, IC = 0 A
IC = 10 mA, IB = 0 A
VCE = 2 V, IC = 0.4 A
VCE = 2 V, IC = 1.2 A
IC = 0.4 A, IB = 40 mA
IC = 1.2 A, IB = 0.12 A
IC = 1.2 A, IB = 0.12 A
Min
�
�
80
100
75
�
�
�
Typ.
�
�
�
�
�
0.04
0.10
0.89
Max
100
100
�
200
�
0.09
0.17
1.10
Unit
nA
nA
V
�
V
V
2023-01-16
Rev.2.0
©2022-2023
Toshiba Electronic Devices & Storage Corporation



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