CD4028BMS

FN3303 Rev 0.00

Page 5 of 10

December 1992

Final Test

100% 5004

2, 3, 8A, 8B, 10, 11

Group A

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

 -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

1 - 7, 9, 14, 15

8, 10 - 13

16

Static Burn-In 2

Note 1

1 - 7, 9, 14, 15

8

10 - 13, 16

Dynamic Burn-

In Note 1

-

8

16

1 - 7, 9, 14, 15

10, 12, 13

11

Irradiation

Note 2

1 - 7, 9, 14, 15

8

10 - 13, 16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

 5%, VDD = 18V  0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

 0.5V

TABLE 6. APPLICABLE SUBGROUPS

(Continued)

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD