PBLS2022D_2

© NXP B.V. 2009. All rights reserved.

Product data sheet

Rev. 02 — 6 September 2009

12 of 16

NXP Semiconductors

PBLS2022D

20 V, 1.8 A PNP BISS loadswitch

8.

Test information

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard

Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

Fig 18. TR1: BISS transistor switching time definition

VCC = −10 V; IC = −1 A; IBon = −50 mA; IBoff =50mA

Fig 19. TR1: Test circuit for switching times

006aaa266

−I

Bon (100 %)

−I

B

input pulse

(idealized waveform)

−I

Boff

90 %

10 %

−I

C (100 %)

−I

C

td

ton

90 %

10 %

tr

output pulse

(idealized waveform)

tf

t

ts

toff

RC

R2

R1

DUT

mgd624

Vo

RB

(probe)

450

Ω

(probe)

450

Ω

oscilloscope

oscilloscope

VBB

VI

VCC