HIP0045

FN4047 Rev 12.00

Page 4 of 10

Apr 1999

Open Load Threshold Voltage

VREF

Open Load Fault Condition, Fault Detected If

VOUT < VREF

0.32 x

VCC

-0.4x

VCC

V

Open Load Pull-Down Current

ISK

No Load, VOUT = VBATT = 16V

20

-

100

A

Over-Current Shutdown Threshold, OUT0 - 5

ISC

VCC = 5V

1.05

1.4

2

A

Short Circuit Current Limit, OUT6, 7

ILIM

VCC = 5V

1.05

1.4

1.75

A

Short Circuit Shutdown Delay, OUT0 - 5

tSC

0.2

-

12

s

Disable Fault Detection Time, Channel IN0,

IN1 After Input Switch Transition

tDF

15

-

50

s

Over-Temperature Detection Threshold

TOFF

155

165

175

oC

LOGIC INPUTS (IN0, IN1, MOSI, SCK, RESET, CE)

Threshold Voltage at Falling Edge

VT-0.2xVCC

--

V

Threshold Voltage at Rising Edge

VT+-

-

0.7xVCC

V

Hysteresis Voltage

VH

VT+ - VT-0.65

-

-

V

Input Current

IIN

VIN = VCC

--

+10

A

Input Pull-Up Resistance

RIN

50

80

200

k



Input Capacitance

CIN

-

-

10

pF

Input Frequency, IN0, IN15

fIN

DC

-

2

kHz

Active Supply Range for Reset State

Change at RESET Pin

VHC-

C_RST

RESET Pin Forced Reset. (Note: Normal VCC

Functional Operating Range is 4.0V to 5.5V)

3.1

-

5.5

V

Low VCC Active Reset Threshold

VLCC_RST Low VCC Forced Reset, (Low Voltage Reset

Active for 0 < VCC < VLCC_RST)

3.1

-

4

V

LOGIC OUTPUT (MISO)

Data Output LOW Voltage

VSOL

ISO = -3.2mA

-

0.2

0.4

V

Data Output HIGH Voltage

VSOH

ISO = -4mA

VCC -

0.4V

--

V

Output Three-State Leakage Current

ISOL

CE = High, 0V

VSO VCC

-10

-

+10

A

Output Capacitance

CSO

fOPER = 3MHz

-

-

10

pF

Electrical Specifications

VCC = 4.5V to 5.5V, TA = -40oC to 125oC, Unless Otherwise Specified (Continued)

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNITS

Serial Peripheral Interface Timing (MOSI, MISO Load Capacitor = 100pF, See Figure 1)

PARAMETER

SYMBOL

TEST CONDITION

MIN

TYP

MAX

UNITS

Clock Frequency, 50% Duty Cycle

fCLK

3-

-

MHz

Enable Lead Time

(SCK Change Low to High after CE = Low)

tLEAD

100

-

-

ns

Enable Lag Time

(Time for SCK Low before CE goes High)

tLAG

150

-

-

ns

Minimum Time SCK = High

tWSCKH

160

-

-

ns

Minimum Time SCK = Low

tWSCKL

160

-

-

ns

Data Setup Time (SCK Change from High to Low

after MOSI Data Valid)

tSU

20

-

-

ns

Data Hold Time (MOSI Data Hold Time SCK

Change from High to Low)

tH

-20

ns

Enable Time from CE = Low to Data at MISO

tEN

-

-

100

ns

Disable Time

(Time for CE Low to High to Output Data Float)

tDIS

-

-

100

ns