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TDA8769 Datasheet(PDF) 21 Page - NXP Semiconductors

Part # TDA8769
Description  12-bit, 60/80/105 Msps Analog-to-Digital Converter (ADC) Nyquist/high IF sampling
PDF  28 Pages
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

TDA8769 Datasheet(HTML) 21 Page - NXP Semiconductors

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2003 Dec 09
21
Philips Semiconductors
Objective specification
12-bit, 60/80/105 Msps Analog-to-Digital Converter
(ADC) Nyquist/high IF sampling
TDA8769
11.5
Definitions
11.5.1
STATIC PARAMETERS
11.5.1.1
Integral non-linearity (INL)
INL is defined as the deviation of the transfer function from
a best fit straight line (linear regression computation). The
INL of code i is obtained from the following equation:
where:
i = code value
Vin = input voltage for code i
S = slope of the ideal straight line (code width).
11.5.1.2
Differential non-linearity (DNL)
DNL is the deviation in code width from the value of one
LSB. The DNL of code i is obtained from the following
equation:
where:
i=0to2n
− 2
Vin = input voltage for code i
S = slope of the ideal straight line.
11.5.2
DYNAMIC PARAMETERS
Figure 15 shows the spectrum of a single tone full-scale
input sine wave with frequency ft, conforming to coherent
sampling and digitized by the ADC under test. Coherent
sampling means that
, where M is the number of
cycles, N the number of samples and both M and N being
a relative prime.
Remark: The parameter Pnoise used in the following
equations includes the power of the random noise,
non-linearities, sampling time errors and quantization
noise.
INL i
()
V
in i
() V
in ideal
()
–
S
----------------------------------------------
=
DNL i
()
V
in i1
+
() V
in i
()
–
S
---------------------------------------------
=
f
t
f
s
----
M
N
-----
=
handbook, full pagewidth
MBL882
0
0
measured output range (MHz)
2.5
magnitude
−20
−40
−60
−80
−100
−120
−160
5
7.5
10
12.5
15
17.5
20
22.5
25
27
−140
IMD3
Fig.15 Spectrum of a full-scale input sine wave with frequency ft.



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