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ST72361 Datasheet(PDF) 218 Page - STMicroelectronics |
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ST72361 Datasheet(HTML) 218 Page - STMicroelectronics |
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218 / 224 page ![]() ST72361 218/224 16 IMPORTANT NOTES 16.1 ALL DEVICES 16.1.1 RESET Pin Protection with LVD Enabled As mentioned in note 2 below Figure 112 on page 199, when the LVD is enabled, it is recommended not to connect a pull-up resistor or capacitor. A 10nF pull-down capacitor is required to filter noise on the reset line. 16.1.2 Clearing Active Interrupts Outside Interrupt Routine When an active interrupt request occurs at the same time as the related flag or interrupt mask is being cleared, the CC register may be corrupted. Concurrent interrupt context The symptom does not occur when the interrupts are handled normally, that is, when: – The interrupt request is cleared (flag reset or in- terrupt mask) within its own interrupt routine – The interrupt request is cleared (flag reset or in- terrupt mask) within any interrupt routine – The interrupt request is cleared (flag reset or in- terrupt mask) in any part of the code while this in- terrupt is disabled If these conditions are not met, the symptom can be avoided by implementing the following se- quence: Perform SIM and RIM operation before and after resetting an active interrupt request Example: SIM reset flag or interrupt mask RIM Nested interrupt context The symptom does not occur when the interrupts are handled normally, that is, when: – The interrupt request is cleared (flag reset or in- terrupt mask) within its own interrupt routine – The interrupt request is cleared (flag reset or in- terrupt mask) within any interrupt routine with higher or identical priority level – The interrupt request is cleared (flag reset or in- terrupt mask) in any part of the code while this in- terrupt is disabled If these conditions are not met, the symptom can be avoided by implementing the following se- quence: PUSH CC SIM reset flag or interrupt mask POP CC 16.1.3 External Interrupt Missed To avoid any risk of generating a parasitic inter- rupt, the edge detector is automatically disabled for one clock cycle during an access to either DDR and OR. Any input signal edge during this period will not be detected and will not generate an inter- rupt. This case can typically occur if the application re- freshes the port configuration registers at intervals during runtime. Workaround The workaround is based on software checking the level on the interrupt pin before and after writ- ing to the PxOR or PxDDR registers. If there is a level change (depending on the sensitivity pro- grammed for this pin) the interrupt routine is in- voked using the call instruction with three extra PUSH instructions before executing the interrupt routine (this is to make the call compatible with the IRET instruction at the end of the interrupt service routine). But detection of the level change does ensure that edge occurs during the critical 1 cycle duration and the interrupt has been missed. This may lead to occurrence of same interrupt twice (one hardware and another with software call). To avoid this, a semaphore is set to '1' before checking the level change. The semaphore is changed to level '0' inside the interrupt routine. When a level change is detected, the semaphore status is checked and if it is '1' this means that the last interrupt has been missed. In this case, the in- terrupt routine is invoked with the call instruction. There is another possible case, that is, if writing to PxOR or PxDDR is done with global interrupts dis- abled (interrupt mask bit set). In this case, the semaphore is changed to '1' when the level change is detected. Detecting a missed interrupt is done after the global interrupts are enabled (inter- rupt mask bit reset) and by checking the status of the semaphore. If it is '1' this means that the last interrupt was missed and the interrupt routine is in- voked with the call instruction. To implement the workaround, the following soft- ware sequence is to be followed for writing into the PxOR/PxDDR registers. The example is for Port PF1 with falling edge interrupt sensitivity. The |
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