INDUSTRIALTEMPERATURERANGE

2

IDT74FCT377AT/CT/DT

FASTCMOSOCTALDFLIP-FLOPWITHCLOCKENABLE

PIN CONFIGURATION

Symbol

Description

Max

Unit

VTERM(2)

Terminal Voltage with Respect to GND

–0.5 to +7

V

VTERM(3)

Terminal Voltage with Respect to GND

–0.5 to VCC+0.5

V

TSTG

Storage Temperature

–65 to +150

° C

IOUT

DC Output Current

–60 to +120

mA

ABSOLUTE MAXIMUM RATINGS(1)

NOTES:

1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause

permanent damage to the device. This is a stress rating only and functional operation

of the device at these or any other conditions above those indicated in the operational

sections of this specification is not implied. Exposure to absolute maximum rating

conditions for extended periods may affect reliability. No terminal voltage may exceed

Vcc by +0.5V unless otherwise noted.

2. Inputs and Vcc terminals only.

3. Output and I/O terminals only.

Symbol

Parameter

(1)

Conditions

Typ.

Max.

Unit

CIN

Input Capacitance

VIN = 0V

6

10

pF

COUT

Output Capacitance

VOUT = 0V

8

12

pF

CAPACITANCE (TA = +25°C, F = 1.0MHz)

NOTE:

1. This parameter is measured at characterization but not tested.

SOIC/ QSOP

TOP VIEW

2

3

1

16

15

14

11

19

18

20

17

13

12

5

6

7

4

8

9

10

D1

O0

D0

VCC

O1

D3

O2

D2

O3

GND

O7

O6

D7

D6

O5

O4

D5

D4

CP

CE

PIN DESCRIPTION

Pin Names

Description

D0 – D7

DataInputs

CE

Clock Enable (Active LOW)

O0 – O7

DataOutputs

C P

Clock Pulse Input

FUNCTION TABLE(1)

Inputs

Outputs

Operating Mode

CP

CE

DO

Load “1”

↑

lh

H

Load “0”

↑

ll

L

Hold

↑

h

X

No Change

H

H

X

No Change

NOTE:

1. H = HIGH Voltage Level

h = HIGH Voltage Level one setup time prior to the LOW-to-HIGH Clock Transition

L = LOW Voltage Level

l

= LOW Voltage Level one setup time prior to the LOW-to-HIGH Clock Transition

X = Don't Care

↑ = LOW-to-HIGH Clock Transition