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UT54ACTS109 Datasheet(PDF) 2 Page - Aeroflex Circuit Technology |
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UT54ACTS109 Datasheet(HTML) 2 Page - Aeroflex Circuit Technology |
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2 / 6 page ![]() RadHard MSI Logic 62 UT54ACS109/UT54ACTS109 LOGIC DIAGRAM RADIATION HARDNESS SPECIFICATIONS 1 Notes: 1. Logic will not latchup during radiation exposure within the limits defined in the table. 2. Device storage elements are immune to SEU affects. ABSOLUTE MAXIMUM RATINGS Note: 1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. PARAMETER LIMIT UNITS Total Dose 1.0E6 rads(Si) SEU Threshold 2 80 MeV-cm 2/mg SEL Threshold 120 MeV-cm 2/mg Neutron Fluence 1.0E14 n/cm 2 PRE Q CLR Q K CLK J SYMBOL PARAMETER LIMIT UNITS VDD Supply voltage -0.3 to 7.0 V VI/O Voltage any pin -.3 to VDD +.3 V TSTG Storage Temperature range -65 to +150 C TJ Maximum junction temperature +175 C TLS Lead temperature (soldering 5 seconds) +300 C JC Thermal resistance junction to case 20 C/W II DC input current 10 mA PD Maximum power dissipation 1 W |
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