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ADC082500 Datasheet(PDF) 13 Page - National Semiconductor (TI) |
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ADC082500 Datasheet(HTML) 13 Page - National Semiconductor (TI) |
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13 / 33 page ![]() Converter Electrical Characteristics (Continued) 20198404 Note 7: To guarantee accuracy, it is required that VA and VDR be well bypassed. Each supply pin must be decoupled with separate bypass capacitors. Additionally, achieving rated performance requires that the backside exposed pad be well grounded. Note 8: Typical figures are at TA = 25˚C, and represent most likely parametric norms. Test limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 9: Calculation of Full-Scale Error for this device assumes that the actual reference voltage is exactly its nominal value. Full-Scale Error for this device, therefore, is a combination of Full-Scale Error and Reference Voltage Error. See Figure 2. For relationship between Gain Error and Full-Scale Error, see Specification Definitions for Gain Error. Note 10: The analog and clock input capacitances are die capacitances only. Additional package capacitances of 0.65 pF differential and 0.95 pF each pin to ground are isolated from the die capacitances by lead and bond wire inductances. Note 11: This parameter is guaranteed by design and is not tested in production. Note 12: This parameter is guaranteed by design and/or characterization and is not tested in production. Note 13: The digital control pin capacitances are die capacitances only. Additional package capacitance of 1.6 pF each pin to ground are isolated from the die capacitances by lead and bond wire inductances. Note 14: Each of the two converters of the ADC082500 has two LVDS output buses, which each clock data out at one half the sample rate. The data at each bus is clocked out at one half the sample rate. The second bus (D0 through D7) has a pipeline latency that is one Input Clock cycle less than the latency of the first bus (Dd0 through Dd7). Note 15: Tying VBG to the supply rail will increase the output offset voltage (VOS) by 400mv (typical), as shown in the VOS specification above. Tying VBG to the supply rail will also affect the differential LVDS output voltage (VOD), causing it to increase by 40mV (typical). Specification Definitions APERTURE (SAMPLING) DELAY is that time required after the fall of the clock input for the sampling switch to open. The Sample/Hold circuit effectively stops capturing the input sig- nal and goes into the “hold” mode the aperture delay time (t AD) after the input clock goes low. APERTURE JITTER (t AJ) is the variation in aperture delay from sample to sample. Aperture jitter shows up as input noise. Bit Error Rate (B.E.R.) is the probability of error and is defined as the probable number of errors per unit of time divided by the number of bits seen in that amount of time. A B.E.R. of 10 -18 corresponds to a statistical error in one bit about every four (4) years. CLOCK DUTY CYCLE is the ratio of the time that the clock wave form is at a logic high to the total time of one clock period. DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1 LSB. Measured at 2.5 GSPS with a ramp input. EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise and Distortion Ratio, or SINAD. ENOB is defined as (SINAD − 1.76) / 6.02 and says that the converter is equivalent to a perfect ADC of this (ENOB) number of bits. FULL POWER BANDWIDTH (FPBW) is a measure of the frequency at which the reconstructed output fundamental drops 3 dB below its low frequency value for a full scale input. GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated from Offset and Full- Scale Errors: Positive Gain Error = Offset Error − Positive Full-Scale Error Negative Gain Error = −(Offset Error − Negative Full- Scale Error) Gain Error = Negative Full-Scale Error − Positive Full- Scale Error = Positive Gain Error + Negative Gain Error INTEGRAL NON-LINEARITY (INL) is a measure of the deviation of each individual code from a straight line through the input to output transfer function. The deviation of any given code from this straight line is measured from the center of that code value. The best fit method is used. INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the power in the second and third order intermodulation products to the power in one of the original frequencies. IMD is usually expressed in dBFS. LSB (LEAST SIGNIFICANT BIT) is the bit that has the smallest value or weight of all bits. This value is V FS /2 n where V FS is the differential full-scale amplitude of 650 mV or 870 mV as set by the FSR input and "n" is the ADC resolution in bits, which is 8 for the ADC082500. LVDS DIFFERENTIAL OUTPUT VOLTAGE (V OD) is the absolute value of the difference between the V D+&VD- outputs; each measured with respect to Ground. www.national.com 13 |
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