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MF4SAM3U15/9BA659 Datasheet(PDF) 16 Page - NXP Semiconductors

Part # MF4SAM3U15/9BA659
Description  MIFARE SAM AV3 secure access module
PDF  26 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MF4SAM3U15/9BA659 Datasheet(HTML) 16 Page - NXP Semiconductors

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NXP Semiconductors
MF4SAM3X_ SDS
MIFARE SAM AV3 secure access module
9 Dynamic characteristics
Remark: The P6022y VB only supports one single IO1.
9.1 General, ISO/IEC 7816 I/O and ISO/IEC 14443 I/O interfaces
Conditions: VDD = 1.62 V to 5.5 V; VSS = 0 V; Tamb = -25°C to 85 °C, unless otherwise specified
Symbol Parameter
Conditions
Min Typ[1] Max
Unit
Input/Output: IO1, IO2 and IO3
-
-
1
μs
tr(i)
Input rise time
Input/reception mode
[2]
[3]
-
-
0.25 ×
tIOWx_min
μs
s
-
-
1
μs
tf(i)
Input fall time
Input/reception mode
[2]
[3]
-
-
0.25 ×
tIOWx_min
μs
tr(o)
Output rise time
Output/transmission mode; CL = 30 pF
-
-
0.1
μs
tf(o)
Output fall time
Output/transmission mode; CL = 30 pF
-
-
0.1
μs
Inputs: CLK and RST_N
fCLK
External clock frequency
in ISO/IEC 7816 UART
applications
tCLKW, Tamb and VDD in their spec'd limits
[4] 0.85 -
11.5
MHz
tCLKW
Clock pulse width i.r.t. clock
period (positive pulse duty
cycle of CLK)
[5] 40
-
60
%
tr(i)CLK
CLK input rise time
[6] -
-
see [6]
tf(i)CLK
CLK input fall time
[6] -
-
see [6]
tr(i)RST
RST_N input rise time
[7] -
-
400
μs
tf(i)RST
RST_N input fall time
[7] -
-
400
μs
tRW
Reset pulse width (RST_N
low)
40
-
-
μs
tWKP
Wake-up time from SLEEP
mode
fCLKmin ≤ fCLK ≤ fCLKmax
-
17
20
μs
level triggered ext.int.
-
20
-
μs
tWKPIO
I/Ox LOW time for wake-up
from SLEEP mode
edge triggered ext.int.
-
20
-
μs
tWKPRST RST_N LOW time for wake-up
from SLEEP mode
40
-
-
μs
Inputs: CLK, RST_N, IO1, IO2, IO3
CPIN
Pin capacitances CLK,
RST_N, IO1, IO2, IO3
Test frequency = 1 MHz; Tamb = 25 °C
-
-
10
pF
Table 10. Electrical AC characteristics of IO1, IO2, IO3, CLK and RST_N
[1]
Typical values are only referenced for information. They are subject to change without notice.
[2]
At minimum IOx input signal HIGH or LOW level voltage pulse width of 3.2 µs. This timing specification applies to ISO7816 configurations down to a
minimum etu duration of 16 CLK cycles at a maximum CLK frequency of 5 MHz (TA1 = 0x96, (Fi/Di) = (512/32)), for example.
[3]
At minimum IOx input signal HIGH or LOW level voltage pulse width of less than 3.2 µs. This timing specification applies to ISO7816 configurations
beyond the conditions listed in note [2], down to a minimum etu duration of 8 CLK cycles at a maximum CLK frequency of 5 MHz (TA1=0x97, (Fi/
MF4SAM3X_SDS
All information provided in this document is subject to legal disclaimers.
© 2024 NXP B.V. All rights reserved.
Product short data sheet
Rev. 3.2 — 5 March 2024
16 / 26



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