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LM2418 Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # LM2418
Description  Triple 30 MHz CRT Driver
PDF  6 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM2418 Datasheet(HTML) 2 Page - National Semiconductor (TI)

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Absolute Maximum Ratings
If MilitaryAerospace specified devices are required
please contact the National Semiconductor Sales
OfficeDistributors for availability and specifications
Supply Voltage Va
a
95V
Storage Temperature Range TSTG
b
25 Cto a100 C
Operating Temperature Range TCASE
b
20 Cto a100 C
Lead Temperature (Soldering k10 sec)
300 C
ESD Tolerance
tbd
Electrical Characteristics
Va e 90V CL e 8 pF DC input bias VIN e 36 VDC 50VPP output swing VBIAS ea12V TA e 25 C unless otherwise noted
Symbol
Parameter
Conditions
LM2418
Units
Min
Typ
Max
ICC
Supply Current (per Amplifier)
No Input or Output Load
18
26
mA
VOUT
Output Offset Voltage
VIN e 36V
46
53
60
VDC
tr
Rise Time
10% to 90% (Note 3)
12
20
ns
tf
Fall Time
10% to 90% (Note 3)
12
20
ns
BW
Bandwidth
b
3 dB
30
MHz
AV
Voltage Gain
b
17
b
19
b
23
VV
OS
Overshoot
5
%
LE
Linearity Error
(Note 1)
8
%
D
AV
Gain Matching
(Note 2)
10
dB
Note 1
Linearity Error is defined as the variation in small signal gain from a20V to a70V output with a 100 mV AC 1 MHz input signal
Note 2
Calculated value from Voltage Gain test on each channel
Note 3
Guaranteed parameter not tested
AC Test Circuit
Figure 2 shows a typical test circuit for evaluation of the LM2418 This circuit is designed to allow testing of the LM2418 in a 50X
environment such as a pulse generator oscilloscope or network analyzer
TLK11125 – 3
8 pF is total load capacitance It includes all parasitic capacitance
FIGURE 2 Test Circuit (One Section)
Typical Performance Characteristics
LM2418 Frequency
Response
TLK11125 – 4
LM2418 Pulse
Response
TLK11125 – 5
FIGURE 3
2



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