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TPCP8301 Datasheet(PDF) 5 Page - Toshiba Semiconductor |
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TPCP8301 Datasheet(HTML) 5 Page - Toshiba Semiconductor |
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5 / 7 page ![]() TPCP8301 2006-11-17 5 30 0 10 20 RDS (ON) – Ta IDR – VDS Vth – Ta PD – Ta Common source Pulse test 0 20 40 60 80 100 −80 −40 0 40 80 120 160 VGS = −2 V VGS = −2.5 V VGS = −4.5 V ID = −5 A −1.3 Common source Ta = 25°C Pulse test 0 0.2 0.4 0.6 0.8 1.0 1.2 −0.1 −100 −1 −10 −5 −3 −1 VGS = 0 V Common source Ta = 25°C VGS = 0 V f = 1 MHz Ciss Coss Crss 100 1000 10000 10 −0.1 −1 −10 −100 −80 −40 0 40 80 160 120 0 −1.2 −1.0 −0.2 (1) (4) (3) (2) 0 0.5 1.0 1.5 2.0 0 40 80 160 120 200 0 −2 −6 −8 −10 0 −4 −8 −12 −20 ID = −2.5 A 1 −0.6 −0.8 −0.4 Common source VDS = −10 V ID = −200 μA Pulse test −4 Common source ID = −5 A Ta = 25°C Pulse test VDD = −16 V VDS −8 VDD = −16 V VGS −4 −8 −16 −4 Ambient temperature Ta (°C) Drain −source voltage VDS (V) Drain −source voltage VDS (V) Capacitance – VDS Ambient temperature Ta (°C) Ambient temperature Ta (°C) Total gate charge Qg (nC) Dynamic input/output characteristics Device mounted on a glass-epoxy board (a) (Note 2a) (1) Single-device operation (Note 3a) (2) Single-device value at dual operation (Note 3b) Device mounted on a glass-epoxy board (b) (Note 2b) (3) Single-device operation (Note 3a) (4) Single-device value at dual operation (Note 3b) t = 10 s |
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