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SN54ABT8543 Datasheet(PDF) 21 Page - Texas Instruments

Part # SN54ABT8543
Description  SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
PDF  31 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

SN54ABT8543 Datasheet(HTML) 21 Page - Texas Instruments

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SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
21
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 13)
SN54ABT8543
SN74ABT8543
UNIT
MIN
MAX
MIN
MAX
UNIT
tw
Pulse duration
LEAB or LEBA high or low
3
3
ns
tsu
Setup time
A before LEAB
↑ or B before LEBA↑
3.5
3
ns
th
Hold time
A after LEAB
↑ or B after LEBA↑
1.5
0.5
ns
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 13)
SN54ABT8543
SN74ABT8543
UNIT
MIN
MAX
MIN
MAX
UNIT
fclock
Clock frequency
TCK
0
50
0
50
MHz
tw
Pulse duration
TCK high or low
5
5
ns
A or B or CE or LE or OE before TCK
↑
6
5
tsu
Setup time
TDI before TCK
↑
6.5
6
ns
TMS before TCK
↑
6
6
A or B or CE or LE or OE after TCK
↑
0.5
0
th
Hold time
TDI after TCK
↑
0
0
ns
TMS after TCK
↑
0
0
td
Delay time
Power up to TCK
↑
50*
50
ns
tr
Rise time
VCC power up
1*
1
µs
* On products compliant to MIL-PRF-38535, this parameter is not production tested.



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