LMP7711

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SNOSAP4F – SEPTEMBER 2005 – REVISED MAY 2013

2.5V ELECTRICAL CHARACTERISTICS

Unless otherwise noted, all limits are ensured for TA = 25°C, V

+ = 2.5V, V− = 0V ,V

O = VCM = V

+/2, V

EN = V

+. Boldface limits

apply at the temperature extremes.

Symbol

Parameter

Conditions

Min(1)

Typ(2)

Max(1)

Units

VOS

Input Offset Voltage

±20

±180

μV

±480

TC VOS Input Offset Voltage Temperature

LMP7711

–1.75

–1

±4

μV/°C

Drift(3)(4)

LMP7712

IB

Input Bias Current

VCM = 1.0V

(5) (4)

−40°C ≤ TA ≤ 85°C

0.05

1

25

pA

−40°C ≤ TA ≤ 125°C

0.05

1

100

IOS

Input Offset Current

VCM = 1.0V

(4)

0.006

0.5

pA

50

CMRR

Common Mode Rejection Ratio

0V

≤ VCM ≤ 1.4V

83

100

dB

80

PSRR

Power Supply Rejection Ratio

2.0V

≤ V+ ≤ 5.5V

85

100

V− = 0V, VCM = 0

80

dB

1.8V

≤ V+ ≤ 5.5V

85

98

V− = 0V, VCM = 0

CMVR

Common Mode Voltage Range

CMRR

≥ 80 dB

−0.3

1.5

V

CMRR

≥ 78 dB

–0.3

1.5

AVOL

Open Loop Voltage Gain

LMP7711, VO = 0.15 to 2.2V

88

98

RL = 2 kΩ to V

+/2

82

LMP7712, VO = 0.15 to 2.2V

84

92

RL = 2 kΩ to V

+/2

80

dB

LMP7711, VO = 0.15 to 2.2V

92

114

RL = 10 kΩ to V

+/2

88

LMP7712, VO = 0.15 to 2.2V

90

95

RL = 10 kΩ to V

+/2

86

VOUT

Output Voltage Swing

RL = 2 kΩ to V

+/2

25

70

High

77

RL = 10 kΩ to V

+/2

20

60

mV from

66

either rail

Output Voltage Swing

RL = 2 kΩ to V

+/2

30

70

Low

73

RL = 10 kΩ to V

+/2

15

60

62

IOUT

Output Current

Sourcing to V−

36

52

VIN = 200 mV

(6)

30

mA

Sinking to V+

7.5

15

VIN = −200 mV

(6)

5.0

IS

Supply Current

LMP7711

0.95

1.30

Enable Mode VEN ≥ 2.1

1.65

mA

LMP7712 (per channel)

1.10

1.50

Enable Mode VEN ≥ 2.1

1.85

Shutdown Mode (per channel)

0.03

1

μA

VEN ≤ 0.4

4

SR

Slew Rate

AV = +1, Rising (10% to 90%)

8.3

V/

μs

AV = +1, Falling (90% to 10%)

10.3

(1)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlations using the

Statistical Quality Control (SQC) method.

(2)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped

production material.

(3)

Offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change.

(4)

This parameter is specified by design and/or characterization and is not tested in production.

(5)

Positive current corresponds to current flowing into the device.

(6)

The short circuit test is a momentary open loop test.

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