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LMH6574 Datasheet(PDF) 13 Page - National Semiconductor (TI) |
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LMH6574 Datasheet(HTML) 13 Page - National Semiconductor (TI) |
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13 / 14 page ![]() Other Applications (Continued) LAYOUT CONSIDERATIONS Whenever questions about layout arise, use the evaluation board as a guide. The LMH730276 is the evaluation board supplied with samples of the LMH6574. To reduce parasitic capacitances, ground and power planes should be removed near the input and output pins. For long signal paths con- trolled impedance lines should be used, along with imped- ance matching elements at both ends. Bypass capacitors should be placed as close to the device as possible. Bypass capacitors from each rail to ground are applied in pairs. The larger electrolytic bypass capacitors can be located farther from the device, the smaller ceramic capacitors should be placed as close to the device as possible. In Figure 1, the capacitor between V + and V− is optional, but is recom- mended for best second harmonic distortion. Another way to enhance performance is to use pairs of 0.01 µF and 0.1 µF ceramic capacitors for each supply bypass. POWER DISSIPATION The LMH6574 is optimized for maximum speed and perfor- mance in the small form factor of the standard SOIC pack- age. To ensure maximum output drive and highest perfor- mance, thermal shutdown is not provided. Therefore, it is of utmost importance to make sure that the T JMAX is never exceeded due to the overall power dissipation. Follow these steps to determine the Maximum power dissi- pation for the LMH6574: 1. Calculate the quiescent (no-load) power: P AMP =ICC* (V S), where VS =V + -V−. 2. Calculate the RMS power dissipated in the output stage: P D (rms) = rms ((VS -VOUT)*IOUT), where VOUT and I OUT are the voltage across and the current through the external load and V S is the total supply voltage. 3. Calculate the total RMS power: P T =PAMP +PD. The maximum power that the LMH6574 package can dissi- pate at a given temperature can be derived with the following equation: P MAX = (150˚ – TAMB)/ θ JA, where TAMB = Ambient tempera- ture (˚C) and θ JA = Thermal resistance, from junction to ambient, for a given package (˚C/W). For the SOIC package θ JA is 130 ˚C/W. ESD PROTECTION The LMH6574 is protected against electrostatic discharge (ESD) on all pins. The LMH6574 will survive 2000V Human Body model and 200V Machine model events. Under normal operation the ESD diodes have no effect on circuit perfor- mance. There are occasions, however, when the ESD di- odes will be evident. If the LMH6574 is driven by a large signal while the device is powered down the ESD diodes will conduct . The current that flows through the ESD diodes will either exit the chip through the supply pins or will flow through the device, hence it is possible to power up a chip with a large signal applied to the input pins. Using the shutdown mode is one way to conserve power and still prevent unexpected operation. EVALUATION BOARDS National Semiconductor provides the following evaluation boards as a guide for high frequency layout and as an aid in device testing and characterization. Many of the data sheet plots were measured with this board. Device Package Evaluation Board LMH6574 SOIC LMH730276 An evaluation board can be shipped when a sample request is placed with National Semiconductor. Samples can be ordered on the National web page. (www.national.com) 20119714 FIGURE 8. Frequency Response vs. Capacitive Load www.national.com 13 |
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