74HC_HCT573

All information provided in this document is subject to legal disclaimers.

© NXP Semiconductors N.V. 2016. All rights reserved.

Product data sheet

Rev. 7 — 4 March 2016

12 of 20

NXP Semiconductors

74HC573; 74HCT573

Octal D-type transparent latch; 3-state

Test data is given in Table 9.

Definitions test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch.

Fig 11. Test circuit for measuring switching times

Table 9.

Test data

Type

Input

Load

S1 position

VI

tr, tf

CL

RL

tPHL, tPLH

tPZH, tPHZ

tPZL, tPLZ

74HC573

VCC

6ns

15pF, 50 pF

1k



open

GND

VCC

74HCT573

3 V

6 ns

15 pF, 50 pF

1 k



open

GND

VCC