Am29F400B

41

General Description

Third paragraph: Added 45 ns to access times.

Product Selector Guide

Ordering Information

Added “Special Designation” to “Optional Processing”

heading; added “0” for 55 ns 10% VCC, deleted burn-in.

Burn-in is available by contacting an AMD representative.

Added -55 ± 10% and -45 speed options to the list of

valid combinations. Added extended temperature

ratings to -55 ±5% valid combinations.

Table 1, Device Bus Operations

temporary sector unprotect to “don’t care” (X).

Figure 6. Maximum Negative Undershoot

Waveform

Corrected figure title.

Table 7, Test Specifications

Test load capacitance: Removed 55 ns speed option

from and added -45 speed option to the 30 pF.

DC Characteristics

AC Characteristics

Added the -45 speed option.

Revision C+4 (August 1998)

Ordering Information

Added extended temperature combinations to the -55,

±10% speed option.

Deleted the -60 speed option.

Revision D (January 1999)

Distinctive Characteristics

Added:

s 20-year data retention at 125

°C

— Reliable operation for the life of the system

DC Characteristics—TTL/NMOS Compatible

DC Characteristics—CMOS Compatible

Erase and Programming Performance

Revision D+1 (July 2, 1999)

Global

Added references to availability of device in Known

Good Die (KGD) form.

Revision E (November 15, 1999)

AC Characteristics—Figure 13. Program

Operations Timing and Figure 14. Chip/Sector

Erase Operations

high.

Physical Dimensions

Replaced figures with more detailed illustrations.

Revision E+1 (November 30, 2000)

Added table of contents. Reinserted revision summa-

ries for revisions A and B.

Trademarks

Copyright © 2000 Advanced Micro Devices, Inc. All rights reserved.

AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.

ExpressFlash

™ is a trademark of Advanced Micro Devices, Inc.

Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.