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P5NC70Z Datasheet(PDF) 3 Page - STMicroelectronics

Part # P5NC70Z
Description  N-CHANNEL 700V - 1.8ohm - 4.6A TO-220/FP/D²PAK/I²PAK Zener-Protected PowerMESH™ II MOSFET
PDF  12 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

P5NC70Z Datasheet(HTML) 3 Page - STMicroelectronics

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STP5NC70Z - STP5NC70ZFP - STB5NC70Z - STB5NC70Z-1
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
SWITCHING OFF
SOURCE DRAIN DIODE
GATE-SOURCE ZENER DIODE
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3.
∆VBV = αT(25°-T) BVGSO(25°)
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally
be applied from gate to source. In this respect the Zener voltage is appropiate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
td(on)
tr
Turn-on Delay Time
Rise Time
VDD =350 V, ID = 2.5 A
RG = 4.7Ω VGS =10V
(see test circuit, Figure 3)
22
10
ns
ns
Qg
Total Gate Charge
VDD =560V, ID = 5A,
VGS =10V
27
36.4
nC
Qgs
Gate-Source Charge
8
nC
Qgd
Gate-Drain Charge
10
nC
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
tr(Voff)
Off-voltage Rise Time
VDD = 560V, ID =5 A,
RG =4.7Ω, VGS = 10V
(see test circuit, Figure 5)
13
ns
tf
Fall Time
14
ns
tc
Cross-over Time
22
ns
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
ISD
Source-drain Current
4.6
A
ISDM (2)
Source-drain Current (pulsed)
18.4
A
VSD (1)
Forward On Voltage
ISD = 4.6 A, VGS =0
1.6
V
trr
Reverse Recovery Time
ISD = 5 A, di/dt = 100A/µs, VDD
= 100V, Tj = 150°C
(see test circuit, Figure 5)
570
ns
Qrr
Reverse Recovery Charge
4.4
µC
IRRM
Reverse Recovery Current
15.5
A
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
BVGSO
Gate-Source Breakdown
Voltage
Igs=± 1mA (Open Drain)
25
V
αT
Voltage Thermal Coefficient
T=25°C Note(3)
1.3
10-4/°C
Rz
Dynamic Resistance
ID =50mA, VGS =0
90
Ω



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