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EX128-CS100 Datasheet(PDF) 13 Page - Actel Corporation |
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EX128-CS100 Datasheet(HTML) 13 Page - Actel Corporation |
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13 / 44 page ![]() eX Automotive Family FPGAs v3.2 1-9 JTAG Instructions Table 1-5 lists the supported instructions with the corresponding IR codes for eX devices. Table 1-6 lists the codes returned after executing the IDCODE instruction for eX devices. Note that bit 0 is always "1." Bits 11-1 are always "02F," which is Actel's manufacturer code. Programming Device programming is supported through Silicon Sculptor series of programmers. In particular, Silicon Sculptor II is a compact, robust, single-site and multi-site device programmer for the PC. With standalone software, Silicon Sculptor II allows concurrent programming of multiple units from the same PC, ensuring the fastest programming times possible. Each fuse is subsequently verified by Silicon Sculptor II to insure correct programming. In addition, integrity tests ensure that no extra fuses are programmed. Silicon Sculptor II also provides extensive hardware self-testing capability. The procedure for programming an eX device using Silicon Sculptor II is as follows: 1. Load the .AFM file 2. Select the device to be programmed 3. Begin programming When the design is ready to go to production, Actel offers device volume-programming services either through distribution partners or via in-house programming from the factory. For more details on programming eX Automotive devices, please refer to the Programming Antifuse Devices and the Silicon Sculptor II User's Guides. Probing Capabilities Automotive-grade eX devices provide internal probing capability that is accessed with the JTAG pins. The Silicon Explorer II Diagnostic hardware is used to control the TDI, TCK, TMS, and TDO pins to select the desired nets for debugging. The user assigns the selected internal nets in the Silicon Explorer II software to the PRA/PRB output pins for observation. Probing functionality is activated when the BST pins are in JTAG mode and the TRST pin is driven High or left floating. If the TRST pin is held Low, the TAP controller will remain in the Test- Logic-Reset state, so no probing can be performed. The Silicon Explorer II automatically places the device into JTAG mode, but the user must drive the TRST pin High or allow the internal pull-up resistor to pull TRST High. When you select the "Reserve Probe" box, as shown in Figure 1-12 on page 1-8, the Designer software reserves the PRA and PRB pins as dedicated outputs for probing. This "reserve" option is merely a guideline. If the Designer software requires that the PRA and PRB pins be user I/Os to achieve successful layout, the tool will use these pins for user I/Os. If you assign user I/Os to the PRA and PRB pins and select the "Reserve Probe" option, Designer Layout will override the option and place user I/Os on those pins. To allow for probing capabilities, the security fuse must not be programmed. Programming the security fuse will disable the probe circuitry. Table 1-7 on page 1-10 summarizes the possible device configurations for probing once the device leaves the "Test-Logic-Reset" JTAG state. Table 1-5 • JTAG Instruction Code Instructions (IR4: IR0) Binary Code EXTEST 00000 SAMPLE / PRELOAD 00001 INTEST 00010 USERCODE 00011 IDCODE 00100 HIGHZ 01110 CLAMP 01111 Diagnostic 10000 BYPASS 11111 Reserved All others Table 1-6 • IDCODE for eX Devices Device Revision Bits 31-28 Bits 27-12 eX64 0 8 40B2, 42B2 eX128 0 9 40B0, 42B0 eX256 0 9 40B5, 42B5 eX64 1 A 40B2, 42B2 eX128 1 B 40B0, 42B0 eX256 1 B 40B5, 42B5 |
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