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ADIS16362

Rev. 0 | Page 15 of 20

DIAGNOSTICS

Self-Test

The self-test function allows the user to verify the mechanical

integrity of each MEMS sensor. It applies an electrostatic force to

each sensor element, which results in mechanical displacement

that simulates a response to actual motion. Table 1 lists the

expected response for each sensor, which provides pass/fail

criteria. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to run the

internal self-test routine, which exercises all inertial sensors,

measures each response, makes pass/fail decisions, and reports

them to error flags in the DIAG_STAT register. MSC_CTRL[10]

resets itself to 0 after completing the routine. The MSC_CTRL[9:8]

bits provide manual control over the self-test function for inves-

tigation of potential failures. Table 25 outlines an example test

flow for using this option to verify the x-axis gyroscope function.

Table 25. Manual Self-Test Example Sequence

DIN

Description

0xB601

SMPL_PRD[7:0] = 0x01, sample rate = 819.2 SPS

0xB904

SENS_AVG[15:8] = 0x04, gyro range = ±300°/sec

0xB802

SENS_AVG[7:0] = 0x02, four-tap averaging filter

Delay = 50 ms

0x0400

Read XGYRO_OUT

0xB502

MSC_CTRL[9] = 1, gyroscope negative self-test

Delay = 50 ms

0x0400

Read XGYRO_OUT

Determine whether the bias in the gyroscope

output changes according to the expectation set

in Table 1

0xB501

MSC_CTRL[9:8] = 01, gyroscope/accelerometer

positive self-test

Delay = 50 ms

0x0400

Read XGYRO_OUT

Determine whether the bias in the gyroscope

changed according to the self-test response in

Table 1

0xB500

MSC_CTRL[15:8] = 0x00

Zero motion provides results that are more reliable. The set-

tings in Table 25 are flexible and allow for optimization around

speed and noise influence. For example, using fewer filtering

taps decreases delay times but increases the possibility of noise

influence.

Memory Test

Setting MSC_CTRL[11] = 1 (DIN = 0xB508) performs a

checksum verification of the flash memory locations. The

pass/fail result is loaded into DIAG_STAT[6].

Status

The error flags provide indicator functions for common

system level issues. All of the flags are cleared (set to 0) after

each DIAG_STAT register read cycle. If an error condition

remains, the error flag returns to 1 during the next sample

cycle. The DIAG_STAT[1:0] bits do not require a read of this

into range, these two flags are cleared automatically.

Table 26. DIAG_STAT Bit Descriptions

Bit

Description

[15]

Z-axis accelerometer self-test failure (1 = fail, 0 = pass)

[14]

Y-axis accelerometer self-test failure (1 = fail, 0 = pass)

[13]

X-axis accelerometer self-test failure (1 = fail, 0 = pass)

[12]

Z-axis gyroscope self-test failure (1 = fail, 0 = pass)

[11]

Y-axis gyroscope self-test failure (1 = fail, 0 = pass)

[10]

X-axis gyroscope self-test failure (1 = fail, 0 = pass)

[9]

Alarm 2 status (1 = active, 0 = inactive)

[8]

Alarm 1 status (1 = active, 0 = inactive)

[7]

Not used

[6]

Flash test, checksum flag (1 = fail, 0 = pass)

[5]

Self-test diagnostic error flag (1 = fail, 0 = pass)

[4]

Sensor overrange (1 = fail, 0 = pass)

[3]

SPI communication failure (1 = fail, 0 = pass)

[2]

Flash update failure (1 = fail, 0 = pass)

[1]

Power supply above 5.25 V

(1 = power supply ≥ 5.25 V, 0 = power supply ≤ 5.25 V)

[0]

Power supply below 4.75 V

(1 = power supply ≤ 4.75 V, 0 = power supply ≥ 4.75 V)

Alarm Registers

The alarm function provides monitoring for two independent

conditions. The ALM_CTRL register provides control inputs

for data source, data filtering (prior to comparison), static

comparison, dynamic rate-of-change comparison, and output

indicator configurations. The ALM_MAGx registers establish

the trigger threshold and polarity configurations. Table 30 gives

an example of how to configure a static alarm. The ALM_SMPLx

registers provide the numbers of samples to use in the dynamic

rate-of-change configuration. The period equals the number in

the ALM_SMPLx register multiplied by the sample period time,

which is established by the SMPL_PRD register. See Table 31 for

an example of how to configure the sensor for this type of function.

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