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AT90SCR100 Datasheet(PDF) 348 Page - ATMEL Corporation

Part # AT90SCR100
Description  8-bit Microcontroller for Smart Card Readers
PDF  433 Pages
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Manufacturer  ATMEL [ATMEL Corporation]
Direct Link  http://www.atmel.com
Logo ATMEL - ATMEL Corporation

AT90SCR100 Datasheet(HTML) 348 Page - ATMEL Corporation

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348
TPR0327AY–SMS–30Jan09
AT90SCR100
• TDI _ JTGTDI: Test Data In. Serial input data to be shifted in to the Instruction Register or
Data Register (Scan Chains).
• TDO _ JTGTDO: Test Data Out. Serial output data from Instruction Register or Data
Register.
The IEEE std. 1149.1 also specifies an optional TAP signal; TRST – Test ReSeT – which is not
provided.
When the JTAGEN Fuse is unprogrammed, these four TAP pins are normal port pins, and the
TAP controller is in reset. When programmed, the input TAP signals are internally pulled high
and the JTAG is enabled for Boundary-scan and programming. The device is shipped with this
fuse programmed.
For the On-chip Debug system, in addition to the JTAG interface pins, the RESET pin is moni-
tored by the debugger to be able to detect external reset sources. The debugger can also pull
the RESET pin low to reset the whole system, assuming only open collectors on the reset line
are used in the application.
Figure 26-1.
Block Diagram
TAP
CONTROLLER
TDI
TDO
TCK
TMS
FLASH
MEMORY
AVR CPU
DIGITAL
PERIPHERAL
UNITS
JTAG / AVR CORE
COMMUNICATION
INTERFACE
BREAKPOINT
UNIT
FLOW CONTROL
UNIT
OCD STATUS
AND CONTROL
INTERNAL
SCAN
CHAIN
M
U
X
INSTRUCTION
REGISTER
ID
REGISTER
BYPASS
REGISTER
JTAG PROGRAMMING
INTERFACE
PC
Instruction
Address
Data
BREAKPOINT
SCAN CHAIN
ADDRESS
DECODER
ANALOG
PERIPHERIAL
UNITS
I/O PORT 0
I/O PORT n
BOUNDARY SCAN CHAIN
Analog inputs
Control & Clock lines
DEVICE BOUNDARY



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