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74LVC2G66GD Datasheet(PDF) 15 Page - NXP Semiconductors |
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74LVC2G66GD Datasheet(HTML) 15 Page - NXP Semiconductors |
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15 / 24 page ![]() 74LVC2G66_4 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 04 — 1 July 2008 15 of 24 NXP Semiconductors 74LVC2G66 Bilateral switch Adjust fi voltage to obtain 0 dBm level at output. Increase fi frequency until dB meter reads −3dB. Fig 21. Test circuit for measuring the frequency response when switch is in ON-state 001aag491 VIH VO VCC 0.5VCC Z/Y Y/Z E 50 Ω fi RL 0.1 µF CL dB Adjust fi voltage to obtain 0 dBm level at input. Fig 22. Test circuit for measuring isolation (OFF-state) 001aag493 VIL VO VCC 0.5VCC Z/Y Y/Z E 50 Ω fi RL 0.5VCC RL 0.1 µF CL dB Fig 23. Test circuit for measuring crosstalk voltage (between digital inputs and switch) 001aag494 VO VCC 0.5VCC Z/Y Y/Z E 50 Ω 600 Ω logic input RL 0.5VCC CL G |
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