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NCP5392 Datasheet(PDF) 21 Page - ON Semiconductor |
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NCP5392 Datasheet(HTML) 21 Page - ON Semiconductor |
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21 / 32 page ![]() NCP5392 http://onsemi.com 21 PWM Comparators with Hysteresis Four PWM comparators receive an error signal at their noninverting input. Each comparator receives one of the triangle waves at its inverting output. The output of each comparator generates the PWM outputs G1, G2, G3, and G4. During steady state operation, the duty cycle will center on the valley of the triangle waveform, with steady state duty cycle calculated by Vout/Vin. During a transient event, both high and low comparator output transitions shift phase to the points where the error signal intersects the down and up ramp of the triangle wave. PROTECTION FEATURES Undervoltage Lockout (VCC and 12VMON) An undervoltage lockout (UVLO) senses the VCC input directly. 12 V UVLO senses the 12 V power supply by connecting it to the 12VMON pin through an appropriate resistor divider. During power−up, both the VCC input and 12VMON are monitored, and the PWM outputs and the soft−start circuit are disabled until both input voltages exceed the threshold voltages of their individual UVLO comparators. The UVLO comparators both incorporate hysteresis to avoid chattering. Overcurrent Shutdown A programmable overcurrent function is incorporated within the IC. A comparator and latch make up this function. The inverting input of the comparator is connected to the ILIM pin. The voltage at this pin sets the maximum output current the converter can produce. The ROSC pin provides a convenient and accurate reference voltage from which a resistor divider can create the overcurrent setpoint voltage. Although not actually disabled, tying the ILIM pin directly to the ROSC pin sets the limit above useful levels − effectively disabling overcurrent shutdown. The comparator noninverting input is the summed current information from the VDRP minus offset voltage. The overcurrent latch is set when the current information exceeds the voltage at the ILIM pin. The outputs are pulled low, and the soft−start is pulled low. The outputs will remain disabled until the VCC voltage is removed and re−applied, or the ENABLE input is brought low and then high. Output Overvoltage and Undervoltage Protection and Power Good Monitor An output voltage monitor is incorporated. During normal operation, if the output voltage is 180 mV (typical) over the DAC voltage, the VR_RDY goes low, the DRVON signal remains high, the PWM outputs are set low. The outputs will remain disabled until the VCC voltage is removed and reapplied. During normal operation, if the output voltage falls more than 350 mV below the DAC setting, the VR_RDY pin will be set low until the output voltage rises. Soft−Start There are two possible soft−start modes: AMD and VR11. AMD mode simply ramps Vcore from 0 V directly to the DAC setting at a fixed rate. The VR11 mode ramps Vcore to 1.1 V boot voltage at a fixed rate of 0.8 mV/mS, pauses at 1.1 V for around 500 mS, reads the VID pins to determine the DAC setting. Then ramps Vcore to the final DAC setting at the Dynamic VID slew rate of up to 12.5 mV/ mS. Typical AMD and VR11 soft−start sequences are shown in the following graphs (Figure 9 and 10). APPLICATION INFORMATION The NCP5392 demo board for the NCP5392 is available by request. It is configured as a four phase solution with decoupling designed to provide a 1 m W load line under a 100 A step load. Startup Procedure Start by installing the test tool software. It is best to power the test tool from a separate ATX power supply. The test tool should be set to a valid VID code of 0.5 V or above in order for the controller to start. Consult the VTT help manual for more detailed instruction. Step Load Testing The VTT tool is used to generate the di/dt step load. Select the dynamic loading option in the VTT test tool software. Set the desired step load size, frequency, duty, and slew rate. See Figure 6. Figure 6. Typical Load Step Response (full load, 35 A − 100 A) Dynamic VID Testing The VTT tool provides for VID stepping based on the Intel Requirements. Select the Dynamic VID option. Before enabling the test set the lowest VID to 0.5 V or greater and set the highest VID to a value that is greater than the lowest VID selection, then enable the test. See Figures 7 and 8. |
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