LH28F016SA datasheet(16/36 Pages) SHARP

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LH28F016SA

16M (1M × 16, 2M × 8) Flash Memory

Timing Nomenclature

For 3.3 V systems timings are measured from where signals cross 1.5 V. For 5.0V systems use the standard JEDEC

crosspoint definitions. Each timing parameter consists of 5 characters. Some common examples are defined below:

tCE

tELQV time (t) from CE » (E) going low (L) to the outputs (Q) becoming valid (V)

tOE

tGLQV time (t) from OE » (G) going low (L) to the outputs (Q) becoming valid (V)

tACC tAVQV time (t) from address (A) valid (V) to the outputs (Q) becoming valid (V)

tAS

tAVWH time (t) from address (A) valid (V) to WE » (W) going high (H)

tDH

tWHDX time (t) from WE » (W) going high (H) to when the data (D) can become undefined (X)

PIN CHARACTERS

PIN STATES

Address Inputs

High

Data Inputs

Low

Data Outputs

Valid

ECE

» (Chip Enable)

Driven, but not necessarily valid

GOE

» (Output Enable)

High Impedance

WE (Write Enable)

PRP

» (Deep Power-Down Pin)

RRY

»/BY » (Ready/Busy)

Any Voltage Level

3/5

» Pin

5 V

CC at 4.5 V Min.

3 V

CC at 3.0 V Min.

LH28F016SA Datasheet(PDF) 16 Page - Sharp Corporation