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WM72016 Datasheet(PDF) 23 Page - Ramtron International Corporation |
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WM72016 Datasheet(HTML) 23 Page - Ramtron International Corporation |
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23 / 32 page ![]() WM72016 – Secure F-RAM with Gen-2 RFID and Serial Port Rev. 1.4 May 2011 Page 23 of 32 SPECIFICATIONS WM72016‟s RFID Interface conforms to the Specification for RFID Air Interface EPC Class-1 Generation-2 UHF RFID Protocol for Communications at 860 MHz – 960 MHz, Version 1.2.0. Options and Exceptions are noted here: State Persistence Requirements WM72016 features infinite state retention for S1, S2, S3, and SL State flags. State flag S0 has no persistence and will always return to state „A‟ upon a power cycle. ELECTRICAL SPECIFICATIONS ABSOLUTE MAXIMUM RATINGS Symbol Description Ratings Notes VDDR, VDDRAW Power Supply Voltage with respect to ANT- -1.0V to +4.5V VIN Voltage on any serial port pin with respect to ANT- -1.0V to +4.5V and VIN < VDD+1.0V TSTG Storage Temperature -55C to + 125C TOP Operating Temperature -40 oC to +85oC TLEAD Lead Temperature (Soldering, 10 seconds) 260 C VESD (ANT+, ANT-) Electrostatic Discharge Voltage - Human Body Model (JEDEC Std JESD22-A114-B) - Charged Device Model (JEDEC Std JESD22-C101-A) - Machine Model (JEDEC Std JESD22-A115-A) 500V 1kV 50V VESD (All other pins) Electrostatic Discharge Voltage - Human Body Model (JEDEC Std JESD22-A114-B) - Charged Device Model (JEDEC Std JESD22-C101-A) - Machine Model (JEDEC Std JESD22-A115-A) 1.5kV 1.5kV 200V ME Memory Endurance: Read or Write or Erase 1x10 14 1 RFexp RF Exposure +10dBm (800 ~ 1000 MHz) Package Moisture Sensitivity Level MSL-2 1. A degradation in memory endurance may occur for VDDR_EXT levels beyond the maximum specification. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only, and the functional operation of the device at these or any other conditions above those listed in the operational section of this specification is not implied. Exposure to absolute maximum ratings conditions for extended periods may affect device reliability. |
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