OPA377

OPA2377

OPA4377

SBOS504B

– FEBRUARY 2010 – REVISED JANUARY 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

ABSOLUTE MAXIMUM RATING

(1)

Over operating free-air temperature range, unless otherwise noted.

OPA377, OPA2377, OPA4377

UNIT

Supply Voltage

+7

V

(V

–) – 0.5 to (V+) + 0.5

V

Signal Input Terminals

±10

mA

Continuous

Operating Temperature

–40 to +150

°C

Storage Temperature

–65 to +150

°C

Junction Temperature

+150

°C

Human Body Model

4000

V

ESD Rating

Charged Device Model

1000

V

Machine Model

200

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

(2)

Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should

be current limited to 10mA or less.

(3)

Short-circuit to ground, one amplifier per package.

PRODUCT

PACKAGE-LEAD

PACKAGE DESIGNATOR

PACKAGE MARKING

SC70-5

DCK

OP377A

OPA377

SOT23-5

DBV

OP377A

SO-8

D

OP377A

SO-8

D

O2377A

OPA2377

MSOP-8

DGK

OTAQ

OPA4377

TSSOP-14

PW

O4377A

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the

device product folder at www.ti.com.

2

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Product Folder Link(s): OPA377 OPA2377 OPA4377