www.ti.com

FEATURES

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1Y

1A

1B

2Y

2A

2B

GND

4Y

4B

4A

3Y

3B

3A

D OR PW PACKAGE

(TOP VIEW)

DESCRIPTION/ORDERING INFORMATION

SN74LVC02A-EP

QUADRUPLE 2-INPUT POSITIVE-NOR GATE

SCAS831 – MARCH 2007

–

2000-V Human-Body Model (A114-A)

• Controlled Baseline

–

200-V Machine Model (A115-A)

–

One Assembly Site

–

1000-V Charged-Device Model (C101)

–

One Test Site

–

One Fabrication Site

• Extended Temperature Performance of –55°C

to 125

°C

• Enhanced Diminishing Manufacturing Sources

(DMS) Support

• Enhanced Product-Change Notification

• Customer-Specific Configuration Control Can

Be Supported Along With Major-Change

Approval

• Inputs Accept Voltages to 5.5 V

• ESD Protection Exceeds JESD 22

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

The SN74LVC02A performs the Boolean function Y = A + B or Y = A

• B in positive logic.

Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in

a mixed 3.3-V/5-V system environment.

ORDERABLE PART NUMBER

TOP-SIDE MARKING

–55

°C to 125°C

TSSOP – PW

Tape and reel

SN74LVC02AMPWREP

LVC02AM

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

Web site at www.ti.com.

(2)

Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at

www.ti.com/sc/package.

FUNCTION TABLE

(EACH GATE)

INPUTS

OUTPUT

Y

A

B

H

X

L

X

H

L

L

L

H

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2007, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.